"Scan-Chain Partition for High Test-Data Compressibility and Low Shift ..."

Sying-Jyan Wang et al. (2009)

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DOI: 10.1109/TCAD.2009.2015741

access: closed

type: Journal Article

metadata version: 2021-10-14

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Sying-Jyan Wang, Katherine Shu-Min Li, Shih-Cheng Chen, Huai-Yan Shiu, Yun-Lung Chu:
Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(5): 716-727 (2009)

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