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"Handling the pin overhead problem of DFTs for high-quality and at-speed tests."

Dong Xiang, Hideo Fujiwara (2002)

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DOI: 10.1109/TCAD.2002.801099

access: closed

type: Journal Article

metadata version: 2020-09-24

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Dong Xiang, Hideo Fujiwara:
Handling the pin overhead problem of DFTs for high-quality and at-speed tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(9): 1105-1113 (2002)

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