"A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis ..."

Joonsik Yoon et al. (2025)

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DOI: 10.1109/TCAD.2024.3499903

access: closed

type: Journal Article

metadata version: 2025-05-09

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Joonsik Yoon, Hayoung Lee, Youngki Moon, Seung Ho Shin, Sungho Kang:
A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(5): 2014-2025 (2025)

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