"Diagnosis of CMOS op-amps with gate oxide short faults using multilayer ..."

S. Yu et al. (1997)

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DOI: 10.1109/43.644623

access: closed

type: Journal Article

metadata version: 2020-09-24

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S. Yu, Barrie W. Jervis, Kevin R. Eckersall, Ian M. Bell:
Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(8): 930-935 (1997)

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