"Multistage Enhanced Diagnosis With Fault Candidate Reduction."

Hyojoon Yun et al. (2025)

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DOI: 10.1109/TCAD.2025.3549352

access: closed

type: Journal Article

metadata version: 2025-09-11

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Hyojoon Yun, Hyeonchan Lim, Hayoung Lee, Sungho Kang:
Multistage Enhanced Diagnosis With Fault Candidate Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(9): 3648-3652 (2025)

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