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"A Built-In Self-Test and In Situ Analog Circuit Optimization Platform."

Sanghoon Lee et al. (2018)

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DOI: 10.1109/TCSI.2018.2805641

access: closed

type: Journal Article

metadata version: 2021-07-28

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Sanghoon Lee, Congyin Shi, Jiafan Wang, Adriana C. Sanabria-Borbon, Hatem Osman, Jiang Hu, Edgar Sánchez-Sinencio:
A Built-In Self-Test and In Situ Analog Circuit Optimization Platform. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(10): 3445-3458 (2018)

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