"Wire Length Characteristics of Multi-Tier Gate-Level Monolithic 3D ICs."

Sheng-En David Lin, Dae Hyun Kim (2019)

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DOI: 10.1109/TETC.2016.2630064

access: closed

type: Journal Article

metadata version: 2021-06-29

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Sheng-En David Lin, Dae Hyun Kim:
Wire Length Characteristics of Multi-Tier Gate-Level Monolithic 3D ICs. IEEE Trans. Emerg. Top. Comput. 7(2): 301-310 (2019)

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