"Nanorobotic Manipulation System for 360° Characterization Atomic ..."

Yongbing Wen et al. (2020)

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DOI: 10.1109/TIE.2019.2910042

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type: Journal Article

metadata version: 2020-05-22

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Yongbing Wen, Haojian Lu, Yajing Shen, Hui Xie:
Nanorobotic Manipulation System for 360° Characterization Atomic Force Microscopy. IEEE Trans. Ind. Electron. 67(4): 2916-2924 (2020)

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