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"Efficient Test Chip Design via Smart Computation."

Chenlei Fang et al. (2023)

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DOI: 10.1145/3558393

access: closed

type: Journal Article

metadata version: 2023-05-17

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Chenlei Fang, Qicheng Huang, Zeye Liu, Ruizhou Ding, Ronald D. Blanton:
Efficient Test Chip Design via Smart Computation. ACM Trans. Design Autom. Electr. Syst. 28(2): 22:1-22:31 (2023)

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