"Dynamic state traversal for sequential circuit test generation."

Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel (2000)

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DOI: 10.1145/348019.348288

access: closed

type: Journal Article

metadata version: 2018-11-06

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Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Dynamic state traversal for sequential circuit test generation. ACM Trans. Design Autom. Electr. Syst. 5(3): 548-565 (2000)

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