"Layout-aware scan chain reorder for launch-off-shift transition test coverage."

Sying-Jyan Wang et al. (2008)

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DOI: 10.1145/1391962.1391972

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/todaes/WangPHL08
Sying-Jyan Wang, Kuo-Lin Peng, Kuang-Cyun Hsiao, Katherine Shu-Min Li:
Layout-aware scan chain reorder for launch-off-shift transition test coverage. ACM Trans. Design Autom. Electr. Syst. 13(4): 64:1-64:16 (2008)

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