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"Sensitivity of reliability-growth models to operational profile errors vs. ..."

Alberto Pasquini, Adalberto Nobiato Crespo, Paolo Matrella (1996)

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DOI: 10.1109/24.556576

access: closed

type: Journal Article

metadata version: 2020-07-09

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  - journals/tr/PasquiniCM96
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Alberto Pasquini, Adalberto Nobiato Crespo, Paolo Matrella:
Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]. IEEE Trans. Reliab. 45(4): 531-540 (1996)

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