default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDIEEE Transactions on Reliability, Volume 45
Volume 45, Number 1, March 1996
- John Newton:
Comment on: Time-varying failure rates in the availability and reliability analysis of repairable systems. - Frank K. Hwang:
Comment/reply: some recent papers on consecutively-connected systems. - P. Lall:
Tutorial: temperature as an input to microelectronics-reliability models. 3-9 - J. R. Gardner:
The appropriateness of plastic encapsulated microcircuits in a specific wooden-round application. 10-18 - Douglas Emerson, Edward Hakim, Anand Govind:
Plastic-encapsulated microcircuit reliability and cost-effectiveness study. 19-22 - B. Johnson, V. Verma:
Reliability assessment of fielded plastic and hermetically packaged microelectronics. 23-26 - Alec Feinberg
, Allan Widom:
Connecting parametric aging to catastrophic failure through thermodynamics. 28-33 - T. Seki, S. Yokoyama:
Robust parameter-estimation using the bootstrap method for the 2-parameter Weibull distribution. 34-41 - George J. Knafl, Joseph A. Morgan:
Solving ML equations for 2-parameter Poisson-process models for ungrouped software-failure data. 42-53 - Nader B. Ebrahimi:
How to model reliability-growth when times of design modifications are known. 54-58 - F. C. Meng:
Comparing the importance of system components by some structural characteristics. 59-65 - L. L. Philipson:
The failure of Bayes system reliability inference based on data with multi-level applicability. 66-68 - L. C. Tang, Y. S. Sun, T. N. Goh, H. L. Ong:
Analysis of step-stress accelerated-life-test data: a new approach. 69-74 - Thomas W. Archibald, Rommert Dekker:
Modified block-replacement for multiple-component systems. 75-83 - J. R. English, T. Sargent, T. L. Landers:
A discretizing approach for stress/strength analysis. 84-89 - A. G. Vassakis:
Safety assessment, reliability, and the probability-operation diagram. 90-94 - Alberto Pasquini, Elio De Agostino, Giuseppe Di Marco:
An input-domain based method to estimate software reliability. 95-105 - J. Collet:
Some remarks on rare-event approximation. 106-108 - S. Niranjan, J. F. Frenzel:
A comparison of fault-tolerant state machine architectures for space-borne electronics. 109-113 - Arkady A. Chernyak, Zhanna A. Chernyak:
A unified domination approach for reliability analysis of networks with arbitrary logic in vertices. 114-119 - Sheng-De Wang, Cha-Hon Sun:
Transformations of star-delta and delta-star reliability networks. 120-126 - V. A. Netes, B. P. Filin:
Consideration of node failures in network-reliability calculation. 127-128 - S. B. Nandi, A. B. Aich:
Hypothesis-test for reliability in a stress-strength model, with prior information. 129-131 - Pasquale Erto, Massimiliano Giorgio:
Modified 'practical Bayes-estimators' [reliability theory]. 132-137 - S. F. Noor, J. R. McDonald:
Forced-outage rates of generating units based on expert evaluation. 138-140 - I. D. Roberts, A. E. Samuel:
The use of imprecise component reliability distributions in reliability calculations. 141-144 - J. D. Wang, T. S. Liu:
Fuzzy reliability using a discrete stress-strength interference model. 145-149 - K. L. Bruning:
Determining the discrete-time reliability of a repairable 2-out-of-(N+1): F system. 150-155 - J. Malinowski, W. Preuss:
Lower and upper bounds for the reliability of connected-(r, s)-out-of-(m, n): F lattice systems. 156-160
Volume 45, Number 2, June 1996
- David W. Coit, Alice E. Smith:
Reliability optimization of series-parallel systems using a genetic algorithm. - Michael G. Pecht:
MilSpecs - To Be Or Not To Be. - A. Schottl:
A reliability model of a system with dependent components. - Doddaballapur Narasimha-Murthy Jayasimha:
Fault tolerance in multisensor networks. - Leon Lantz:
Soft errors induced by alpha particles. 174-179 - Edward J. Kross, Michael A. Sicuranza:
Commercial-Components Initiative: Ground Benign Systems-plastic encapsulated microcircuits. 180-183 - Nihal Sinnadurai:
Plastic packaging is highly reliable. 184-193 - Erik H. Ingermann, James F. Frenzel:
Behavior of a radiation-immune CMOS logic family under resistive shorts. 194-199 - Jing Lee, Jung-Hua Chou:
Hierarchical placement for power hybrid circuits under reliability and wireability constraints. 200-207 - Stephen E. Chick, Max B. Mendel:
An engineering basis for statistical lifetime models with an application to tribology. 208-215 - Adiel Teixeira de Almeida, G. A. Bohoris:
Decision theory in maintenance strategy of standby system with gamma-distribution repair-time. 216-219 - I. Sahin, H. Polatoglu:
Maintenance strategies following the expiration of warranty. 220-228 - J. S. Usher:
Weibull component reliability-prediction in the presence of masked data. 229-232 - Dennis K. J. Lin, John S. Usher, Frank M. Guess:
Bayes estimation of component-reliability from masked system-life data. 233-237 - Benjamin Reiser, Betty J. Flehinger, Andrew R. Conn:
Estimating component-defect probability from masked system success/failure data. 238-243 - M. S. Mackisack, R. H. Stillman:
A cautionary tale about Weibull analysis [reliability estimation]. 244-248 - H. V. Kulkarni, R. N. Rattihalli:
Characterization of bivariate mean residual-life function. 249-253 - Renkuan G. Guo, Charles Ernie Love:
Linear-spline approximation for semi-parametric modeling of failure data with proportional hazards. 261-266 - Klaus Bänsch, Axel Hein, Manish Malhotra, Kishor S. Trivedi:
Comment/correction: dependability modeling using Petri nets. 272-273 - Douglas M. Blough:
Performance evaluation of a reconfiguration-algorithm for memory arrays containing clustered faults. 274-284 - Paul Peichuan Chen, Antoine N. Mourad, W. Kent Fuchs:
Probability of correctness of processor-array outputs using periodic concurrent error detection. 285-296 - R. Keith Scott, David F. McAllister:
Cost modeling of N-version fault-tolerant software systems for large N. 297-302 - Oded Berman, Michal Cutler:
Choosing an optimal set of libraries [software reliability]. 303-307 - Sang Hyuk Kang, Min Young Chung, Dan Keun Sung:
Analysis of satellite on-board time-space-time switching networks with multiple separated space switches. 316-320 - Alexander Gersht, Shaygan Kheradpir, Alexander Shulman:
Dynamic bandwidth-allocation and path-restoration in SONET self-healing networks. 321-331 - Gilles Muller, Michel Banâtre, Nadine Peyrouze, Bruno Rochat:
Lessons from FTM: An Experiment in Design and Implementation of a Low-Cost Fault-Tolerant System. 332-339 - I. H. Khamis, J. J. Higgins:
Optimum 3-step step-stress tests. 341-345 - O. I. Tyoskin, S. Y. Krivolapov:
Nonparametric model for step-stress accelerated life testing. 346-350
Volume 45, Number 3, September 1996
- R. Evans:
Rituals - The Quick & Easy Way. - P. Gottfried:
Knowledge vs Understanding. - R. Evans:
Difficulties With Reliability Incentives. - Ram Chillarege:
What Is Software Failure? - Rakesh Agarwal:
Predicting Field-Performance of Automotive Electronic Products. - R. Evans:
Real Reliability. - Anthony A. Salvia:
Some results on discrete mean residual life. 359-361 - Nader Ebrahimi:
Engineering notion of mean-residual-life and hazard-rate for finite populations with known distributions. 362-368 - Daniel R. Jeske:
Estimating the cumulative downtime distribution of a highly reliable component. 369-374 - Jayant Rajgopal, Mainak Mazumdar:
A system-based component test plan for a series system, with type-II censoring. 375-378 - Mu-Yeh Huang, D. McBeth, Stephen B. Vardeman:
Development test programs for 1-shot systems: 2-state reliability and binary development-test results. 379-385 - Dhananjay Kumar, Ulf Westberg:
Proportional hazards modeling of time-dependent covariates using linear regression: a case study [mine power cable reliability]. 386-392 - G. Hartless, Lawrence Leemis:
Computational algebra applications in reliability theory. 393-399 - Jan Gerhard Norstrøm:
The use of precautionary loss functions in risk analysis. 400-403 - Ramesh Karri, Alex Orailoglu:
Time-constrained scheduling during high-level synthesis of fault-secure VLSI digital signal processors. 404-412 - Yu G. Chen, Maria C. Yuang:
A cut-based method for terminal-pair reliability. 413-416 - Néstor R. Barraza, Bruno Cernuschi-Frías, Félix Cernuschi:
Applications and extensions of the chains-of-rare-events model. 417-421 - Yves Dutuit, Antoine Rauzy:
A linear-time algorithm to find modules of fault trees. 422-425 - Manish Malhotra:
An efficient stiffness-insensitive method for transient analysis of Markov availability models. 426-428 - Darrell G. Linton, Soheil Khajenoori, Y. Yi, Gil Hebert:
A fast algorithm for repair-depot reliability-evaluation. 429-432 - Sebastián Martorell, Aurelio Munõz, Vicente Serradell:
Age-dependent models for evaluating risks and costs of surveillance and maintenance of components. 433-442 - Dimiter R. Avresky, Jean Arlat, Jean-Claude Laprie, Yves Crouzet:
Fault injection for formal testing of fault tolerance. 443-455 - Taghi M. Khoshgoftaar, Robert M. Szabo:
Using neural networks to predict software faults during testing. 456-462 - Mhamed-Ali El-Aroui, C. Lavergne:
Generalized linear models in software reliability: parametric and semi-parametric approaches. 463-470 - Ram C. Tiwari, Yizhou Yang, Jyoti N. Zalkikar:
Bayes estimation for the Pareto failure-model using Gibbs sampling. 471-476 - Alex S. Papadopoulos, Ram C. Tiwari, Jyoti N. Zalkikar:
Hierarchical Bayes estimation for the exponential-multinomial model in reliability and competing risks. 477-484 - C. A. Clarotti, Fabio Spizzichino:
Predictive Bayes design of Scram systems: related mathematics and philosophical implications. 485-490 - Johan René van Dorp, Thomas A. Mazzuchi, G. E. Fornell, L. R. Pollock:
A Bayes approach to step-stress accelerated life testing. 491-498 - W. J. Zimmer, John J. Deely:
A Bayes ranking of survival distributions using accelerated or correlated data. 499-504 - Raffaela Calabria, Maurizio Guida, Gianpaolo Pulcini:
A reliability-growth model in a Bayes-decision framework. 505-510
Volume 45, Number 4, December 1996
- Amit M. Paradkar, Kuo-Chung Tai, Mladen A. Vouk:
Automatic test-generation for predicates [software testing]. 515-530 - Alberto Pasquini, Adalberto Nobiato Crespo, Paolo Matrella:
Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]. 531-540 - Rong-Huei Hou, Sy-Yen Kuo, Yi-Ping Chang:
Needed resources for software module test, using the hyper-geometric software reliability growth model. 541-549 - Peter G. Bishop, Robin E. Bloomfield:
A conservative theory for long-term reliability-growth prediction [of software]. 550-560 - Anshuman Thakur, Ravishankar K. Iyer:
Analyze-NOW-an environment for collection and analysis of failures in a network of workstations. 561-570 - Huamin Liu, Viliam Makis:
Cutting-tool reliability assessment in variable machining conditions. 573-581 - Arthur Fries, Ananda Sen:
A survey of discrete reliability-growth models. 582-604 - Agapios N. Platis, Nikolaos Limnios, Marc Le Du:
Performability of electric-power systems modeled by non-homogeneous Markov chains. 605-610 - Do Sun Bai, Hyung Je Yun:
Accelerated life tests for products of unequal size. 611-618 - Emanuel P. Barbosa, Enrico A. Colosimo, Francisco Louzada-Neto:
Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models. 619-623 - Tadashi Takano, Takahiro Yamada, Kohshiro Shutoh, Nobuyasu Kanekawa:
In-orbit experiment on the fault-tolerant space computer aboard the satellite Hiten. 624-631 - Sandro Morasca:
Assessment of fault-detection processes: an approach based on reliability techniques. 632-637 - Nong Ye:
The presentation of knowledge and state-information for system fault diagnosis. 638-645 - Rong-Huei Hou, Sy-Yen Kuo, Yi-Ping Chang:
Optimal release policy for hyper-geometric distribution software-reliability growth model. 646-651 - Mohamed-Ali El-Aroui, Jean-Louis Soler:
A Bayes nonparametric framework for software-reliability analysis. 652-660 - Elsayed A. Elsayed, Hongzhou Wang:
Bayes and classical estimation of environmental factors for the binomial distribution. 661-665 - H. K. Hsieh:
Prediction intervals for Weibull observations, based on early-failure data. 666-670 - Zhenmin Chen, Jie Mi:
Confidence interval for the mean of the exponential distribution, based on grouped data. 671-677 - Frank Boesch, Daniel Gross, Charles L. Suffel:
A coherent model for reliability of multiprocessor networks. 678-684 - Jorge Navarro, José-María Ruiz:
Failure-rate functions for doubly-truncated random variables. 685-690
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2025-05-24 00:45 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
