"ERCN* merged nets for modeling degraded behavior and parallel processes in ..."

MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung (2004)

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DOI: 10.1109/TSMCA.2003.820579

access: closed

type: Journal Article

metadata version: 2020-05-25

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MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung:
ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. IEEE Trans. Syst. Man Cybern. Part A 34(1): 102-112 (2004)

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