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"Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal ..."

Jing Guo et al. (2014)

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DOI: 10.1109/TVLSI.2013.2238565

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/GuoXMZ14
Jing Guo, Liyi Xiao, Zhigang Mao, Qiang Zhao:
Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code. IEEE Trans. Very Large Scale Integr. Syst. 22(1): 127-135 (2014)

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