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"X-Tolerant Compactor maXpress for In-System Test Applications With ..."

Yingdi Liu et al. (2021)

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DOI: 10.1109/TVLSI.2021.3092421

access: closed

type: Journal Article

metadata version: 2021-08-12

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  - https://dblp.org/rec/journals/tvlsi/LiuMMMRTW21
Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak:
X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan. IEEE Trans. Very Large Scale Integr. Syst. 29(8): 1553-1566 (2021)

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