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"Hard-to-Detect Fault Analysis in FinFET SRAMs."

Guilherme Cardoso Medeiros et al. (2021)

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DOI: 10.1109/TVLSI.2021.3071940

access: closed

type: Journal Article

metadata version: 2021-06-15

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  - journals/tvlsi/MedeirosFWTPH21
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  - https://dblp.org/rec/journals/tvlsi/MedeirosFWTPH21
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui:
Hard-to-Detect Fault Analysis in FinFET SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 29(6): 1271-1284 (2021)

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