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"Time and Area Optimized Testing of Automotive ICs."

Nilanjan Mukherjee et al. (2021)

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DOI: 10.1109/TVLSI.2020.3025138

access: closed

type: Journal Article

metadata version: 2021-02-11

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  - https://dblp.org/rec/journals/tvlsi/MukherjeeTSLMMM21
Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Time and Area Optimized Testing of Automotive ICs. IEEE Trans. Very Large Scale Integr. Syst. 29(1): 76-88 (2021)

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