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"Simulation of Enhanced Interface Trapping Due to Carrier Dynamics in ..."

John R. Barker, Jeremy R. Watling (2001)

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DOI: 10.1155/2001/70818

access: open

type: Journal Article

metadata version: 2023-09-12

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  - https://dblp.org/rec/journals/vlsi/BarkerW01
John R. Barker, Jeremy R. Watling:
Simulation of Enhanced Interface Trapping Due to Carrier Dynamics in Warped Valence Bands in SiGe Devices. VLSI Design 13(1-4): 453-458 (2001)

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