"Choice of a High-Level Fault Model for the Optimization of Validation Test ..."

Yves Joannon et al. (2008)

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DOI: 10.1155/2008/596146

access: open

type: Journal Article

metadata version: 2022-04-09

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Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro:
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test. VLSI Design 2008: 596146:1-596146:9 (2008)

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