"ADC Production Test Technique Using Low-Resolution Arbitrary Waveform ..."

Vincent Kerzerho et al. (2008)

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DOI: 10.1155/2008/482159

access: open

type: Journal Article

metadata version: 2018-11-24

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Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib:
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: 482159:1-482159:8 (2008)

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