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"A Pull-in Based Test Mechanism for Device Diagnostic and Process ..."

Luís Alexandre Rocha et al. (2008)

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DOI: 10.1155/2008/283451

access: open

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/vlsi/RochaMCWS08
Luís Alexandre Rocha, Lukas Mol, Edmond Cretu, Reinoud F. Wolffenbuttel, José Machado da Silva:
A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization. VLSI Design 2008: 283451:1-283451:7 (2008)

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