Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated ..."

Ioannis Voyiatzis (2008)

> Home

Details and statistics

DOI: 10.1155/2008/680157

access: open

type: Journal Article

metadata version: 2018-11-24

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/Voyiatzis08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/Voyiatzis08
Ioannis Voyiatzis:
A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences. VLSI Design 2008: 680157:1-680157:8 (2008)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.