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@inproceedings{DBLP:conf/vts/AhmedT22, author = {Soyed Tuhin Ahmed and Mehdi B. Tahoori}, title = {Fault-tolerant Neuromorphic Computing with Functional {ATPG} for Post-manufacturing Re-calibration}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794185}, doi = {10.1109/VTS52500.2021.9794185}, timestamp = {Mon, 01 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/AhmedT22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/AvciOK22, author = {Muslum Emir Avci and Sule Ozev and Y. B. Chethan Kumar}, title = {Fast {RF} Mismatch Calibration Using Built-in Detectors}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794160}, doi = {10.1109/VTS52500.2021.9794160}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/AvciOK22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/BilgicO22, author = {Bora Bilgic and Sule Ozev}, title = {Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794141}, doi = {10.1109/VTS52500.2021.9794141}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/BilgicO22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/BiswasG22, author = {Baishakhi Rani Biswas and Sandeep Gupta}, title = {Memristor-Specific Failures: New Verification Methods and Emerging Test Problems}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794274}, doi = {10.1109/VTS52500.2021.9794274}, timestamp = {Tue, 26 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/BiswasG22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/CantoroGMSSR22, author = {Riccardo Cantoro and Francesco Garau and Riccardo Masante and Sandro Sartoni and Virendra Singh and Matteo Sonza Reorda}, title = {Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794219}, doi = {10.1109/VTS52500.2021.9794219}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/CantoroGMSSR22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Chakravarty22, author = {Sreejit Chakravarty}, title = {Special Session: {A} Call to Standardize Chip-let Interconnect Testing}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--3}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794149}, doi = {10.1109/VTS52500.2021.9794149}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Chakravarty22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/ChatterjeeLDP22, author = {Debarshi Chatterjee and Parth Lathigara and Siddhanth Dhodhi and Chad Parsons}, title = {{FIFO} Topology Aware Stalling for Accelerating Coverage Convergence of Stalling Regressions}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794164}, doi = {10.1109/VTS52500.2021.9794164}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/ChatterjeeLDP22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Chaudhary22, author = {Nitin Chaudhary}, title = {Innovative Practices Track: Novel Methods for Validation and Test}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794248}, doi = {10.1109/VTS52500.2021.9794248}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Chaudhary22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/ChaudhuriTC22, author = {Arjun Chaudhuri and Jonti Talukdar and Krishnendu Chakrabarty}, title = {Special Session: Fault Criticality Assessment in {AI} Accelerators}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--4}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794215}, doi = {10.1109/VTS52500.2021.9794215}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/ChaudhuriTC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/DaveMHGSAS22, author = {Shail Dave and Alberto Marchisio and Muhammad Abdullah Hanif and Amira Guesmi and Aviral Shrivastava and Ihsen Alouani and Muhammad Shafique}, title = {Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure {ML} Systems}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--14}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794253}, doi = {10.1109/VTS52500.2021.9794253}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/DaveMHGSAS22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Detofsky22, author = {Abram Detofsky}, title = {Special Session: {A} Testability Practitioner's Guide to Chiplets}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--2}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794277}, doi = {10.1109/VTS52500.2021.9794277}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Detofsky22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/FarayolaBCSRC22, author = {Praise O. Farayola and Isaac Bruce and Shravan K. Chaganti and Abalhassan Sheikh and Srivaths Ravi and Degang Chen}, title = {The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794216}, doi = {10.1109/VTS52500.2021.9794216}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/FarayolaBCSRC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/GanjiSC22, author = {Mona Ganji and Marampally Saikiran and Degang Chen}, title = {All Digital Low-Overhead {SAR} {ADC} Built-In Self-Test for Fault Detection and Diagnosis}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794271}, doi = {10.1109/VTS52500.2021.9794271}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/GanjiSC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/GebregiorgisWMR22, author = {Anteneh Gebregiorgis and Lizhou Wu and Christopher M{\"{u}}nch and Siddharth Rao and Mehdi B. Tahoori and Said Hamdioui}, title = {Special Session: STT-MRAMs: Technology, Design and Test}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--10}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794278}, doi = {10.1109/VTS52500.2021.9794278}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/GebregiorgisWMR22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/GoelPL22, author = {Sandeep Kumar Goel and Sandeep Pendharkar and Chunsheng Liu}, title = {Innovative Practices Track: Test of 3D ICs {\&} Chiplets}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794242}, doi = {10.1109/VTS52500.2021.9794242}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/GoelPL22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Guerrero-Balaguera22, author = {Juan{-}David Guerrero{-}Balaguera and Josie E. Rodriguez Condia and Matteo Sonza Reorda}, title = {A New Method to Generate Software Test Libraries for In-Field {GPU} Testing Resorting to High-Level Languages}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794225}, doi = {10.1109/VTS52500.2021.9794225}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Guerrero-Balaguera22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/GulickJLOC22, author = {Daniel W. Gulick and Yuna Jung and Seunghyun Lee and Sule Ozev and Jennifer Blain Christen}, title = {Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794142}, doi = {10.1109/VTS52500.2021.9794142}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/GulickJLOC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Hasler22, author = {Jennifer Hasler}, title = {Special Session: Testing and Characterization for Large-Scale Programmable Analog Systems}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--5}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794203}, doi = {10.1109/VTS52500.2021.9794203}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Hasler22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/HsuLWJWC22, author = {Ho{-}Chieh Hsu and Cheng{-}Che Lu and Shih{-}Wei Wang and Kelly Jones and Kai{-}Chiang Wu and Mango C.{-}T. Chao}, title = {Rule Generation for Classifying {SLT} Failed Parts}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794184}, doi = {10.1109/VTS52500.2021.9794184}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/HsuLWJWC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/JoeMPR22, author = {Jerin Joe and Nilanjan Mukherjee and Irith Pomeranz and Janusz Rajski}, title = {Fast Test Generation for Structurally Similar Circuits}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794232}, doi = {10.1109/VTS52500.2021.9794232}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/JoeMPR22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/KibriaFFT22, author = {Rasheed Kibria and Nusrat Farzana and Farimah Farahmandi and Mark M. Tehranipoor}, title = {FSMx: Finite State Machine Extraction from Flattened Netlist With Application to Security}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794151}, doi = {10.1109/VTS52500.2021.9794151}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/KibriaFFT22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/KunduBRB22, author = {Shamik Kundu and Suvadeep Banerjee and Arnab Raha and Kanad Basu}, title = {Special Session: Effective In-field Testing of Deep Neural Network Hardware Accelerators}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--4}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794227}, doi = {10.1109/VTS52500.2021.9794227}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/KunduBRB22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/LiWG22, author = {Mingye Li and Fangzhou Wang and Sandeep Gupta}, title = {Methods for testing path delay and static faults in {RSFQ} circuits}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794245}, doi = {10.1109/VTS52500.2021.9794245}, timestamp = {Fri, 22 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/LiWG22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/LiuGLNLL22, author = {Cheng Liu and Zhen Gao and Siting Liu and Xuefei Ning and Huawei Li and Xiaowei Li}, title = {Special Session: Fault-Tolerant Deep Learning: {A} Hierarchical Perspective}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--12}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794239}, doi = {10.1109/VTS52500.2021.9794239}, timestamp = {Mon, 08 Jan 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/LiuGLNLL22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/MangelsdorfMMBI22, author = {Chris Mangelsdorf and Manasa Madhvaraj and Salvador Mir and Manuel J. Barrag{\'{a}}n and Daisuke Iimori and Takayuki Nakatani and Shogo Katayama and Gaku Ogihara and Yujie Zhao and Jianglin Wei and Anna Kuwana and Kentaroh Katoh and Kazumi Hatayama and Haruo Kobayashi and Keno Sato and Takashi Ishida and Toshiyuki Okamoto and Tamotsu Ichikawa}, title = {Innovative Practices Track: Innovative Analog Circuit Testing Technologies}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794191}, doi = {10.1109/VTS52500.2021.9794191}, timestamp = {Wed, 28 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/MangelsdorfMMBI22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/MayahiniaJT22, author = {Mahta Mayahinia and Atousa Jafari and Mehdi B. Tahoori}, title = {Voltage Tuning for Reliable Computation in Emerging Resistive Memories}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794233}, doi = {10.1109/VTS52500.2021.9794233}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/MayahiniaJT22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/MenonK22, author = {Sankaran M. Menon and Rolf K{\"{u}}hnis}, title = {Special Session: Closed Chassis Platform Debug of Compute Systems using the Functional Ubiquitous {USB} Type-C Receptacle}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--4}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794171}, doi = {10.1109/VTS52500.2021.9794171}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/MenonK22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/MertenHD22, author = {Marcel Merten and Sebastian Huhn and Rolf Drechsler}, title = {A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization Operators for On-Chip Transient Fault Detection}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794161}, doi = {10.1109/VTS52500.2021.9794161}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/MertenHD22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/MozaffariBSSFVM22, author = {Seyed Nima Mozaffari and Bonita Bhaskaran and Shantanu Sarangi and Suhas M. Satheesh and Kuo Lin Fu and Nithin Valentine and P. Manikandan and Mahmut Yilmaz}, title = {On-Die Noise Measurement During Automatic Test Equipment {(ATE)} Testing and In-System-Test {(IST)}}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--6}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794251}, doi = {10.1109/VTS52500.2021.9794251}, timestamp = {Tue, 28 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/MozaffariBSSFVM22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/MunchYKT22, author = {Christopher M{\"{u}}nch and Jongsin Yun and Martin Keim and Mehdi B. Tahoori}, title = {MBIST-based Trim-Search Test Time Reduction for {STT-MRAM}}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794178}, doi = {10.1109/VTS52500.2021.9794178}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/MunchYKT22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/NeethirajanNWNW22, author = {Deepika Neethirajan and V. A. Niranjan and Richard Willis and Amit Nahar and D. Webster and Yiorgos Makris}, title = {Machine Learning-Based Overkill Reduction through Inter-Test Correlation}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794170}, doi = {10.1109/VTS52500.2021.9794170}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/NeethirajanNWNW22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/NelapatlaSDS22, author = {Bala Tarun Nelapatla and Rahul Singhal and Michael Daub and Zoran Stanojevics}, title = {Innovative Practices Track: High Speed Test Fabric}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794166}, doi = {10.1109/VTS52500.2021.9794166}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/NelapatlaSDS22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/PanLC22, author = {Renjian Pan and Xin Li and Krishnendu Chakrabarty}, title = {Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794192}, doi = {10.1109/VTS52500.2021.9794192}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/PanLC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Pancholi22, author = {Vineet Pancholi}, title = {Special Session: Test Impact of Multi-Die Packages}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--2}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794143}, doi = {10.1109/VTS52500.2021.9794143}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Pancholi22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/PandeyTSNNS22, author = {Amit Pandey and Brendan Tully and Abhijeet Samudra and Ajay Nagarandal and Karthikeyan Natarajan and Rahul Singhal}, title = {Novel Technique for Manufacturing {\&} In-system Testing of Large Scale SoC using Functional Protocol Based High-Speed {I/O}}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794234}, doi = {10.1109/VTS52500.2021.9794234}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/PandeyTSNNS22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Parekhji22, author = {Rubin A. Parekhji}, title = {Innovative Practices Track: New Methods for System Level Test of Image Projection and Radar {VLSI} Systems}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794263}, doi = {10.1109/VTS52500.2021.9794263}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Parekhji22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/PavlidisFLS22, author = {Antonios Pavlidis and Eric Faehn and Marie{-}Minerve Lou{\"{e}}rat and Haralampos{-}G. Stratigopoulos}, title = {Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--8}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794208}, doi = {10.1109/VTS52500.2021.9794208}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/PavlidisFLS22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/PengWLYTASHZM22, author = {Minqiang Peng and Youfa Wu and Jialiang Li and Alex Yu and Grigor Tshagharyan and Costas Argyrides and Vilas Sridharan and Gurgen Harutyunyan and Yervant Zorian and Nilanjan Mukherjee}, title = {Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794190}, doi = {10.1109/VTS52500.2021.9794190}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/PengWLYTASHZM22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/QuTPMK22, author = {Gang Qu and Benjamin Tan and Kuheli Pratihar and Debdeep Mukhopadhyay and Ramesh Karri}, title = {Innovation Practices Track: Security in Test and Test for Security}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794269}, doi = {10.1109/VTS52500.2021.9794269}, timestamp = {Sun, 12 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/QuTPMK22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/SadiHLAKGBK22, author = {Mehdi Sadi and Yi He and Yanjing Li and Mahabubul Alam and Satwik Kundu and Swaroop Ghosh and Javad Bahrami and Naghmeh Karimi}, title = {Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--12}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794194}, doi = {10.1109/VTS52500.2021.9794194}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/SadiHLAKGBK22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/ShahC22, author = {Sahil Shah and Jennifer Blain Christen}, title = {Special Session: Calibrating mismatch in an {ISFET} with a Floating-Gate}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--4}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794140}, doi = {10.1109/VTS52500.2021.9794140}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/ShahC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Sinha22, author = {Arani Sinha}, title = {Innovative Practices Track: Silent Data Errors}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794173}, doi = {10.1109/VTS52500.2021.9794173}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Sinha22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Sinha22a, author = {Arani Sinha}, title = {Innovative Practices Track: Next Generation Test Standards}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794243}, doi = {10.1109/VTS52500.2021.9794243}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/Sinha22a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/SuCMZ22, author = {Fei Su and Stephen Crosher and Andrea Matteucci and Yuwen Zou}, title = {Innovation Practices Track: Silicon Telemetry for Dependability}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794204}, doi = {10.1109/VTS52500.2021.9794204}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/SuCMZ22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/YanQCCHWG22, author = {Aibin Yan and Kuikui Qian and Jie Cui and Ningning Cui and Zhengfeng Huang and Xiaoqing Wen and Patrick Girard}, title = {A Highly Reliable and Low Power {RHBD} Flip-Flop Cell for Aerospace Applications}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--6}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794197}, doi = {10.1109/VTS52500.2021.9794197}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/YanQCCHWG22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/YilmazJNSSSTCKS22, author = {Mahmut Yilmaz and Pavan Kumar Datla Jagannadha and Kaushik Narayanun and Shantanu Sarangi and Francisco Da Silva and Joe Sarmiento and Smbat Tonoyan and Ashwin Chintaluri and Animesh Khare and Milind Sonawane and Ashish Kumar and Anitha Kalva and Alex Hsu and Jayesh Pandey}, title = {{NVIDIA} {MATHS:} Mechanism to Access Test-Data over High-Speed Links}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794146}, doi = {10.1109/VTS52500.2021.9794146}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/YilmazJNSSSTCKS22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/ZhengYLWCKRR22, author = {Shi{-}Xuan Zheng and Chung{-}Yu Yeh and Kuen{-}Jong Lee and Chen Wang and Wu{-}Tung Cheng and Mark Kassab and Janusz Rajski and Sudhakar M. Reddy}, title = {Accurate Estimation of Test Pattern Counts for a Wide-Range of {EDT} Input/Output Channel Configurations}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794207}, doi = {10.1109/VTS52500.2021.9794207}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/ZhengYLWCKRR22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/ZhouGLA22, author = {Ziqi Zhou and Ujjwal Guin and Peng Li and Vishwani D. Agrawal}, title = {Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794254}, doi = {10.1109/VTS52500.2021.9794254}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/ZhouGLA22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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