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Publication search results
found 48 matches
- 2022
- Soyed Tuhin Ahmed, Mehdi B. Tahoori:
Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration. VTS 2022: 1-7 - Muslum Emir Avci, Sule Ozev, Y. B. Chethan Kumar:
Fast RF Mismatch Calibration Using Built-in Detectors. VTS 2022: 1-7 - Bora Bilgic, Sule Ozev:
Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components. VTS 2022: 1-7 - Baishakhi Rani Biswas, Sandeep Gupta:
Memristor-Specific Failures: New Verification Methods and Emerging Test Problems. VTS 2022: 1-7 - Riccardo Cantoro, Francesco Garau, Riccardo Masante, Sandro Sartoni, Virendra Singh, Matteo Sonza Reorda:
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries. VTS 2022: 1-7 - Sreejit Chakravarty:
Special Session: A Call to Standardize Chip-let Interconnect Testing. VTS 2022: 1-3 - Debarshi Chatterjee, Parth Lathigara, Siddhanth Dhodhi, Chad Parsons:
FIFO Topology Aware Stalling for Accelerating Coverage Convergence of Stalling Regressions. VTS 2022: 1-7 - Nitin Chaudhary:
Innovative Practices Track: Novel Methods for Validation and Test. VTS 2022: 1 - Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty:
Special Session: Fault Criticality Assessment in AI Accelerators. VTS 2022: 1-4 - Shail Dave, Alberto Marchisio, Muhammad Abdullah Hanif, Amira Guesmi, Aviral Shrivastava, Ihsen Alouani, Muhammad Shafique:
Special Session: Towards an Agile Design Methodology for Efficient, Reliable, and Secure ML Systems. VTS 2022: 1-14 - Abram Detofsky:
Special Session: A Testability Practitioner's Guide to Chiplets. VTS 2022: 1-2 - Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS 2022: 1-7 - Mona Ganji, Marampally Saikiran, Degang Chen:
All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis. VTS 2022: 1-7 - Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui:
Special Session: STT-MRAMs: Technology, Design and Test. VTS 2022: 1-10 - Sandeep Kumar Goel, Sandeep Pendharkar, Chunsheng Liu:
Innovative Practices Track: Test of 3D ICs & Chiplets. VTS 2022: 1 - Juan-David Guerrero-Balaguera, Josie E. Rodriguez Condia, Matteo Sonza Reorda:
A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages. VTS 2022: 1-7 - Daniel W. Gulick, Yuna Jung, Seunghyun Lee, Sule Ozev, Jennifer Blain Christen:
Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants. VTS 2022: 1-7 - Jennifer Hasler:
Special Session: Testing and Characterization for Large-Scale Programmable Analog Systems. VTS 2022: 1-5 - Ho-Chieh Hsu, Cheng-Che Lu, Shih-Wei Wang, Kelly Jones, Kai-Chiang Wu, Mango C.-T. Chao:
Rule Generation for Classifying SLT Failed Parts. VTS 2022: 1-7 - Jerin Joe, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski:
Fast Test Generation for Structurally Similar Circuits. VTS 2022: 1-7 - Rasheed Kibria, Nusrat Farzana, Farimah Farahmandi, Mark M. Tehranipoor:
FSMx: Finite State Machine Extraction from Flattened Netlist With Application to Security. VTS 2022: 1-7 - Shamik Kundu, Suvadeep Banerjee, Arnab Raha, Kanad Basu:
Special Session: Effective In-field Testing of Deep Neural Network Hardware Accelerators. VTS 2022: 1-4 - Mingye Li, Fangzhou Wang, Sandeep Gupta:
Methods for testing path delay and static faults in RSFQ circuits. VTS 2022: 1-7 - Cheng Liu, Zhen Gao, Siting Liu, Xuefei Ning, Huawei Li, Xiaowei Li:
Special Session: Fault-Tolerant Deep Learning: A Hierarchical Perspective. VTS 2022: 1-12 - Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel J. Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa:
Innovative Practices Track: Innovative Analog Circuit Testing Technologies. VTS 2022: 1 - Mahta Mayahinia, Atousa Jafari, Mehdi B. Tahoori:
Voltage Tuning for Reliable Computation in Emerging Resistive Memories. VTS 2022: 1-7 - Sankaran M. Menon, Rolf Kühnis:
Special Session: Closed Chassis Platform Debug of Compute Systems using the Functional Ubiquitous USB Type-C Receptacle. VTS 2022: 1-4 - Marcel Merten, Sebastian Huhn, Rolf Drechsler:
A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization Operators for On-Chip Transient Fault Detection. VTS 2022: 1-7 - Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas M. Satheesh, Kuo Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz:
On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). VTS 2022: 1-6 - Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori:
MBIST-based Trim-Search Test Time Reduction for STT-MRAM. VTS 2022: 1-7
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