Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSearch dblp for Publications
export results for "toc:db/conf/vts/vts20222.bht:"
download as .bib file
@inproceedings{DBLP:conf/vts/AhmedT22,
author = {Soyed Tuhin Ahmed and
Mehdi B. Tahoori},
title = {Fault-tolerant Neuromorphic Computing with Functional {ATPG} for Post-manufacturing
Re-calibration},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794185},
doi = {10.1109/VTS52500.2021.9794185},
timestamp = {Mon, 01 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/AhmedT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AvciOK22,
author = {Muslum Emir Avci and
Sule Ozev and
Y. B. Chethan Kumar},
title = {Fast {RF} Mismatch Calibration Using Built-in Detectors},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794160},
doi = {10.1109/VTS52500.2021.9794160},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/AvciOK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BilgicO22,
author = {Bora Bilgic and
Sule Ozev},
title = {Performance Degradation Monitoring for Analog Circuits Using Lightweight
Built-in Components},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794141},
doi = {10.1109/VTS52500.2021.9794141},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/BilgicO22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BiswasG22,
author = {Baishakhi Rani Biswas and
Sandeep Gupta},
title = {Memristor-Specific Failures: New Verification Methods and Emerging
Test Problems},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794274},
doi = {10.1109/VTS52500.2021.9794274},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/BiswasG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CantoroGMSSR22,
author = {Riccardo Cantoro and
Francesco Garau and
Riccardo Masante and
Sandro Sartoni and
Virendra Singh and
Matteo Sonza Reorda},
title = {Exploiting post-silicon debug hardware to improve the fault coverage
of Software Test Libraries},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794219},
doi = {10.1109/VTS52500.2021.9794219},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/CantoroGMSSR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Chakravarty22,
author = {Sreejit Chakravarty},
title = {Special Session: {A} Call to Standardize Chip-let Interconnect Testing},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--3},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794149},
doi = {10.1109/VTS52500.2021.9794149},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Chakravarty22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChatterjeeLDP22,
author = {Debarshi Chatterjee and
Parth Lathigara and
Siddhanth Dhodhi and
Chad Parsons},
title = {{FIFO} Topology Aware Stalling for Accelerating Coverage Convergence
of Stalling Regressions},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794164},
doi = {10.1109/VTS52500.2021.9794164},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChatterjeeLDP22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Chaudhary22,
author = {Nitin Chaudhary},
title = {Innovative Practices Track: Novel Methods for Validation and Test},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794248},
doi = {10.1109/VTS52500.2021.9794248},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Chaudhary22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChaudhuriTC22,
author = {Arjun Chaudhuri and
Jonti Talukdar and
Krishnendu Chakrabarty},
title = {Special Session: Fault Criticality Assessment in {AI} Accelerators},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--4},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794215},
doi = {10.1109/VTS52500.2021.9794215},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChaudhuriTC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DaveMHGSAS22,
author = {Shail Dave and
Alberto Marchisio and
Muhammad Abdullah Hanif and
Amira Guesmi and
Aviral Shrivastava and
Ihsen Alouani and
Muhammad Shafique},
title = {Special Session: Towards an Agile Design Methodology for Efficient,
Reliable, and Secure {ML} Systems},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--14},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794253},
doi = {10.1109/VTS52500.2021.9794253},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/DaveMHGSAS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Detofsky22,
author = {Abram Detofsky},
title = {Special Session: {A} Testability Practitioner's Guide to Chiplets},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--2},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794277},
doi = {10.1109/VTS52500.2021.9794277},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Detofsky22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FarayolaBCSRC22,
author = {Praise O. Farayola and
Isaac Bruce and
Shravan K. Chaganti and
Abalhassan Sheikh and
Srivaths Ravi and
Degang Chen},
title = {The Least-Squares Approach to Systematic Error Identification and
Calibration in Semiconductor Multisite Testing},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794216},
doi = {10.1109/VTS52500.2021.9794216},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/FarayolaBCSRC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GanjiSC22,
author = {Mona Ganji and
Marampally Saikiran and
Degang Chen},
title = {All Digital Low-Overhead {SAR} {ADC} Built-In Self-Test for Fault
Detection and Diagnosis},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794271},
doi = {10.1109/VTS52500.2021.9794271},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/GanjiSC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GebregiorgisWMR22,
author = {Anteneh Gebregiorgis and
Lizhou Wu and
Christopher M{\"{u}}nch and
Siddharth Rao and
Mehdi B. Tahoori and
Said Hamdioui},
title = {Special Session: STT-MRAMs: Technology, Design and Test},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--10},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794278},
doi = {10.1109/VTS52500.2021.9794278},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/GebregiorgisWMR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GoelPL22,
author = {Sandeep Kumar Goel and
Sandeep Pendharkar and
Chunsheng Liu},
title = {Innovative Practices Track: Test of 3D ICs {\&} Chiplets},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794242},
doi = {10.1109/VTS52500.2021.9794242},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/GoelPL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Guerrero-Balaguera22,
author = {Juan{-}David Guerrero{-}Balaguera and
Josie E. Rodriguez Condia and
Matteo Sonza Reorda},
title = {A New Method to Generate Software Test Libraries for In-Field {GPU}
Testing Resorting to High-Level Languages},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794225},
doi = {10.1109/VTS52500.2021.9794225},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Guerrero-Balaguera22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GulickJLOC22,
author = {Daniel W. Gulick and
Yuna Jung and
Seunghyun Lee and
Sule Ozev and
Jennifer Blain Christen},
title = {Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical
Implants},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794142},
doi = {10.1109/VTS52500.2021.9794142},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/GulickJLOC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Hasler22,
author = {Jennifer Hasler},
title = {Special Session: Testing and Characterization for Large-Scale Programmable
Analog Systems},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794203},
doi = {10.1109/VTS52500.2021.9794203},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Hasler22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HsuLWJWC22,
author = {Ho{-}Chieh Hsu and
Cheng{-}Che Lu and
Shih{-}Wei Wang and
Kelly Jones and
Kai{-}Chiang Wu and
Mango C.{-}T. Chao},
title = {Rule Generation for Classifying {SLT} Failed Parts},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794184},
doi = {10.1109/VTS52500.2021.9794184},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/HsuLWJWC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JoeMPR22,
author = {Jerin Joe and
Nilanjan Mukherjee and
Irith Pomeranz and
Janusz Rajski},
title = {Fast Test Generation for Structurally Similar Circuits},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794232},
doi = {10.1109/VTS52500.2021.9794232},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/JoeMPR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KibriaFFT22,
author = {Rasheed Kibria and
Nusrat Farzana and
Farimah Farahmandi and
Mark M. Tehranipoor},
title = {FSMx: Finite State Machine Extraction from Flattened Netlist With
Application to Security},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794151},
doi = {10.1109/VTS52500.2021.9794151},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/KibriaFFT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KunduBRB22,
author = {Shamik Kundu and
Suvadeep Banerjee and
Arnab Raha and
Kanad Basu},
title = {Special Session: Effective In-field Testing of Deep Neural Network
Hardware Accelerators},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--4},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794227},
doi = {10.1109/VTS52500.2021.9794227},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/KunduBRB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiWG22,
author = {Mingye Li and
Fangzhou Wang and
Sandeep Gupta},
title = {Methods for testing path delay and static faults in {RSFQ} circuits},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794245},
doi = {10.1109/VTS52500.2021.9794245},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/LiWG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuGLNLL22,
author = {Cheng Liu and
Zhen Gao and
Siting Liu and
Xuefei Ning and
Huawei Li and
Xiaowei Li},
title = {Special Session: Fault-Tolerant Deep Learning: {A} Hierarchical Perspective},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--12},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794239},
doi = {10.1109/VTS52500.2021.9794239},
timestamp = {Mon, 08 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuGLNLL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MangelsdorfMMBI22,
author = {Chris Mangelsdorf and
Manasa Madhvaraj and
Salvador Mir and
Manuel J. Barrag{\'{a}}n and
Daisuke Iimori and
Takayuki Nakatani and
Shogo Katayama and
Gaku Ogihara and
Yujie Zhao and
Jianglin Wei and
Anna Kuwana and
Kentaroh Katoh and
Kazumi Hatayama and
Haruo Kobayashi and
Keno Sato and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa},
title = {Innovative Practices Track: Innovative Analog Circuit Testing Technologies},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794191},
doi = {10.1109/VTS52500.2021.9794191},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MangelsdorfMMBI22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MayahiniaJT22,
author = {Mahta Mayahinia and
Atousa Jafari and
Mehdi B. Tahoori},
title = {Voltage Tuning for Reliable Computation in Emerging Resistive Memories},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794233},
doi = {10.1109/VTS52500.2021.9794233},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MayahiniaJT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MenonK22,
author = {Sankaran M. Menon and
Rolf K{\"{u}}hnis},
title = {Special Session: Closed Chassis Platform Debug of Compute Systems
using the Functional Ubiquitous {USB} Type-C Receptacle},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--4},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794171},
doi = {10.1109/VTS52500.2021.9794171},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MenonK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MertenHD22,
author = {Marcel Merten and
Sebastian Huhn and
Rolf Drechsler},
title = {A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization
Operators for On-Chip Transient Fault Detection},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794161},
doi = {10.1109/VTS52500.2021.9794161},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MertenHD22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MozaffariBSSFVM22,
author = {Seyed Nima Mozaffari and
Bonita Bhaskaran and
Shantanu Sarangi and
Suhas M. Satheesh and
Kuo Lin Fu and
Nithin Valentine and
P. Manikandan and
Mahmut Yilmaz},
title = {On-Die Noise Measurement During Automatic Test Equipment {(ATE)} Testing
and In-System-Test {(IST)}},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794251},
doi = {10.1109/VTS52500.2021.9794251},
timestamp = {Tue, 28 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MozaffariBSSFVM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MunchYKT22,
author = {Christopher M{\"{u}}nch and
Jongsin Yun and
Martin Keim and
Mehdi B. Tahoori},
title = {MBIST-based Trim-Search Test Time Reduction for {STT-MRAM}},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794178},
doi = {10.1109/VTS52500.2021.9794178},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MunchYKT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NeethirajanNWNW22,
author = {Deepika Neethirajan and
V. A. Niranjan and
Richard Willis and
Amit Nahar and
D. Webster and
Yiorgos Makris},
title = {Machine Learning-Based Overkill Reduction through Inter-Test Correlation},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794170},
doi = {10.1109/VTS52500.2021.9794170},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/NeethirajanNWNW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NelapatlaSDS22,
author = {Bala Tarun Nelapatla and
Rahul Singhal and
Michael Daub and
Zoran Stanojevics},
title = {Innovative Practices Track: High Speed Test Fabric},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794166},
doi = {10.1109/VTS52500.2021.9794166},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/NelapatlaSDS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PanLC22,
author = {Renjian Pan and
Xin Li and
Krishnendu Chakrabarty},
title = {Semi-Supervised Root-Cause Analysis with Co-Training for Integrated
Systems},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794192},
doi = {10.1109/VTS52500.2021.9794192},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/PanLC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Pancholi22,
author = {Vineet Pancholi},
title = {Special Session: Test Impact of Multi-Die Packages},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--2},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794143},
doi = {10.1109/VTS52500.2021.9794143},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Pancholi22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PandeyTSNNS22,
author = {Amit Pandey and
Brendan Tully and
Abhijeet Samudra and
Ajay Nagarandal and
Karthikeyan Natarajan and
Rahul Singhal},
title = {Novel Technique for Manufacturing {\&} In-system Testing of Large
Scale SoC using Functional Protocol Based High-Speed {I/O}},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794234},
doi = {10.1109/VTS52500.2021.9794234},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/PandeyTSNNS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Parekhji22,
author = {Rubin A. Parekhji},
title = {Innovative Practices Track: New Methods for System Level Test of Image
Projection and Radar {VLSI} Systems},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794263},
doi = {10.1109/VTS52500.2021.9794263},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Parekhji22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PavlidisFLS22,
author = {Antonios Pavlidis and
Eric Faehn and
Marie{-}Minerve Lou{\"{e}}rat and
Haralampos{-}G. Stratigopoulos},
title = {Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--8},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794208},
doi = {10.1109/VTS52500.2021.9794208},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/PavlidisFLS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PengWLYTASHZM22,
author = {Minqiang Peng and
Youfa Wu and
Jialiang Li and
Alex Yu and
Grigor Tshagharyan and
Costas Argyrides and
Vilas Sridharan and
Gurgen Harutyunyan and
Yervant Zorian and
Nilanjan Mukherjee},
title = {Innovative Practices Track: What's Next for Automotive: Where and
How to Improve Field Test and Enhance SoC Safety},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794190},
doi = {10.1109/VTS52500.2021.9794190},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/PengWLYTASHZM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/QuTPMK22,
author = {Gang Qu and
Benjamin Tan and
Kuheli Pratihar and
Debdeep Mukhopadhyay and
Ramesh Karri},
title = {Innovation Practices Track: Security in Test and Test for Security},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794269},
doi = {10.1109/VTS52500.2021.9794269},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/QuTPMK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SadiHLAKGBK22,
author = {Mehdi Sadi and
Yi He and
Yanjing Li and
Mahabubul Alam and
Satwik Kundu and
Swaroop Ghosh and
Javad Bahrami and
Naghmeh Karimi},
title = {Special Session: On the Reliability of Conventional and Quantum Neural
Network Hardware},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--12},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794194},
doi = {10.1109/VTS52500.2021.9794194},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SadiHLAKGBK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ShahC22,
author = {Sahil Shah and
Jennifer Blain Christen},
title = {Special Session: Calibrating mismatch in an {ISFET} with a Floating-Gate},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--4},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794140},
doi = {10.1109/VTS52500.2021.9794140},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ShahC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Sinha22,
author = {Arani Sinha},
title = {Innovative Practices Track: Silent Data Errors},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794173},
doi = {10.1109/VTS52500.2021.9794173},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Sinha22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Sinha22a,
author = {Arani Sinha},
title = {Innovative Practices Track: Next Generation Test Standards},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794243},
doi = {10.1109/VTS52500.2021.9794243},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Sinha22a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SuCMZ22,
author = {Fei Su and
Stephen Crosher and
Andrea Matteucci and
Yuwen Zou},
title = {Innovation Practices Track: Silicon Telemetry for Dependability},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794204},
doi = {10.1109/VTS52500.2021.9794204},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/SuCMZ22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YanQCCHWG22,
author = {Aibin Yan and
Kuikui Qian and
Jie Cui and
Ningning Cui and
Zhengfeng Huang and
Xiaoqing Wen and
Patrick Girard},
title = {A Highly Reliable and Low Power {RHBD} Flip-Flop Cell for Aerospace
Applications},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794197},
doi = {10.1109/VTS52500.2021.9794197},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/YanQCCHWG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YilmazJNSSSTCKS22,
author = {Mahmut Yilmaz and
Pavan Kumar Datla Jagannadha and
Kaushik Narayanun and
Shantanu Sarangi and
Francisco Da Silva and
Joe Sarmiento and
Smbat Tonoyan and
Ashwin Chintaluri and
Animesh Khare and
Milind Sonawane and
Ashish Kumar and
Anitha Kalva and
Alex Hsu and
Jayesh Pandey},
title = {{NVIDIA} {MATHS:} Mechanism to Access Test-Data over High-Speed Links},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794146},
doi = {10.1109/VTS52500.2021.9794146},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/YilmazJNSSSTCKS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhengYLWCKRR22,
author = {Shi{-}Xuan Zheng and
Chung{-}Yu Yeh and
Kuen{-}Jong Lee and
Chen Wang and
Wu{-}Tung Cheng and
Mark Kassab and
Janusz Rajski and
Sudhakar M. Reddy},
title = {Accurate Estimation of Test Pattern Counts for a Wide-Range of {EDT}
Input/Output Channel Configurations},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794207},
doi = {10.1109/VTS52500.2021.9794207},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ZhengYLWCKRR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhouGLA22,
author = {Ziqi Zhou and
Ujjwal Guin and
Peng Li and
Vishwani D. Agrawal},
title = {Fault Modeling and Test Generation for Technology-Specific Defects
of Skyrmion Logic Circuits},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794254},
doi = {10.1109/VTS52500.2021.9794254},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ZhouGLA22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
retrieved on 2024-05-15 19:16 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
