- Georgia-Ann Klutke, Yoonjung Yang:
The availability of inspected systems subject to shocks and graceful degradation. IEEE Trans. Reliab. 51(3): 371-374 (2002) - Joseph Kreimer:
Effectiveness-analysis of real-time data acquisition and processing multichannel systems. IEEE Trans. Reliab. 51(1): 91-99 (2002) - Mamidala Jagadesh Kumar, Vikram Verma:
Elimination of bipolar induced drain breakdown and single transistor latch in submicron PD SOI MOSFET. IEEE Trans. Reliab. 51(3): 367-370 (2002) - Min-Sheng Lin:
A linear-time algorithm for computing K-terminal reliability on proper interval graphs. IEEE Trans. Reliab. 51(1): 58-62 (2002) - Michael R. Lyu, Sampath Rangarajan, Aad P. A. van Moorsel:
Optimal allocation of test resources for software reliability growth modeling in software development. IEEE Trans. Reliab. 51(2): 183-192 (2002) - Lisa M. Maillart, Stephen M. Pollock:
Cost-optimal condition-monitoring for predictive maintenance of 2-phase systems. IEEE Trans. Reliab. 51(3): 322-330 (2002) - Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich:
Software reliability growth with test coverage. IEEE Trans. Reliab. 51(4): 420-426 (2002) - Ellen Overton McSorley, Jye-Chyi Lu, Chin-Shang Li:
Performance of parameter-estimates in step-stress accelerated life-tests with various sample-sizes. IEEE Trans. Reliab. 51(3): 271-277 (2002) - Leila Meshkat, Joanne Bechta Dugan, John D. Andrews:
Dependability analysis of systems with on-demand and active failure modes, using dynamic fault trees. IEEE Trans. Reliab. 51(2): 240-251 (2002) - Jeffrey A. Mittereder, Jason A. Roussos, Wallace T. Anderson, Dimitrios E. Ioannou:
Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction. IEEE Trans. Reliab. 51(4): 482-485 (2002) - Mitchell J. Mondro:
Approximation of mean time between failure when a system has periodic maintenance. IEEE Trans. Reliab. 51(2): 166-167 (2002) - K. Muralidharan:
Reliability inferences of modulated power-law process #i. IEEE Trans. Reliab. 51(1): 23-26 (2002) - J. Hariharan Nair, Sanjeev V. Sabnis:
A reliability test-plan for series systems with components having stochastic failure rates. IEEE Trans. Reliab. 51(1): 17-22 (2002) - Mehrdad Nourani, Amir Attarha:
Detecting signal-overshoots for reliability analysis in high-speed system-on-chips. IEEE Trans. Reliab. 51(4): 494-504 (2002) - Ennis T. Ogawa, Ki-Don Lee, Volker A. Blaschke, Paul S. Ho:
Electromigration reliability issues in dual-damascene Cu interconnections. IEEE Trans. Reliab. 51(4): 403-419 (2002) - Nahmsuk Oh, Edward J. McCluskey:
Error detection by selective procedure call duplication for low energy consumption. IEEE Trans. Reliab. 51(4): 392-402 (2002) - Nahmsuk Oh, Philip P. Shirvani, Edward J. McCluskey:
Error detection by duplicated instructions in super-scalar processors. IEEE Trans. Reliab. 51(1): 63-75 (2002) - Nahmsuk Oh, Philip P. Shirvani, Edward J. McCluskey:
Control-flow checking by software signatures. IEEE Trans. Reliab. 51(1): 111-122 (2002) - Stephen W. Ormon, C. Richard Cassady, Allen G. Greenwood:
Reliability prediction models to support conceptual design. IEEE Trans. Reliab. 51(2): 151-157 (2002) - Nohpill Park, Fabrizio Lombardi:
Analysis of stratified testing for multichip module systems. IEEE Trans. Reliab. 51(1): 100-110 (2002) - Franco Pellerey, Kyriakos I. Petakos:
Closure property of the NBUC class under formation of parallel systems. IEEE Trans. Reliab. 51(4): 452-454 (2002) - Jonás D. Pfefferman, Bruno Cernuschi-Frías:
A nonparametric nonstationary procedure for failure prediction. IEEE Trans. Reliab. 51(4): 434-442 (2002) - Gianpaolo Pulcini:
Correction to "How to model reliability-growth when times of design modifications are known". IEEE Trans. Reliab. 51(2): 252-253 (2002) - A. V. Ramesh, David W. Twigg, Upender R. Sandadi, Tilak C. Sharma:
Reliability analysis of systems with operation-time management. IEEE Trans. Reliab. 51(1): 39-48 (2002) - Michael E. Robinson, Martin Crowder:
The use of residuals in statistical modeling for fatigue-crack growth under constant amplitude loading. IEEE Trans. Reliab. 51(2): 216-222 (2002) - Ahmed A. Soliman:
Reliability estimation in a generalized life-model with application to the Burr-XII. IEEE Trans. Reliab. 51(3): 337-343 (2002) - Xiaolin Teng, Hoang Pham:
A software-reliability growth model for N-version programming systems. IEEE Trans. Reliab. 51(3): 311-321 (2002) - Siew-Leng Teng, Kwee-Poo Yeo:
A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests. IEEE Trans. Reliab. 51(2): 177-182 (2002) - Jussi K. Vaurio:
Treatment of general dependencies in system fault-tree and risk analysis. IEEE Trans. Reliab. 51(3): 278-287 (2002) - Liudong Xing, Joanne Bechta Dugan:
Analysis of generalized phased-mission system reliability, performance, and sensitivity. IEEE Trans. Reliab. 51(2): 199-211 (2002)