19th LATS 2018: Sao Paulo, Brazil

Session 1: Reliability Analysis in SoCs

Session 2: Manufacturing Test and Silicon Validation

Session 3: Fault Tolerant Architectures

Session 4: Fault Injection Strategies

Session 5: Exploring Redundancy for Fault Tolerant Systems

Session 6: Test and Fault Tolerance in Memories

Poster Session 1

Session 7: Fault Tolerance Techniques

Session 8: Aging Modeling and Mitigation

Session 9: Testing and Security of Microprocessor Cores

Session 10: Testing Techniques for Embedded Systems

Session 11: Testing of Analog Systems

Session 12: Dependable Embedded Systems

Poster Session 2

Session 13: Electrical Characterization and PV Analysis

a service of Schloss Dagstuhl - Leibniz Center for Informatics