Zhuo Li 0001

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Bei Yu 0001

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Publications

2018
[j18]
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  - journals/tcad/LinYXGVLLAP18
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  - https://dblp.org/rec/journals/tcad/LinYXGVLLAP18
Yibo Lin, Bei Yu, Xiaoqing Xu, Jhih-Rong Gao, Natarajan Viswanathan, Wen-Hao Liu, Zhuo Li, Charles J. Alpert, David Z. Pan:
MrDP: Multiple-Row Detailed Placement of Heterogeneous-Sized Cells for Advanced Nodes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(6): 1237-1250 (2018)
2017
[j17]
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  - journals/integration/LinYZLAP17
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Yibo Lin, Bei Yu, Yi Zou, Zhuo Li, Charles J. Alpert, David Z. Pan:
Stitch aware detailed placement for multiple E-beam lithography. Integr. 58: 47-54 (2017)
2016
[c57]
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  - conf/aspdac/LinYZ0AP16
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Yibo Lin, Bei Yu, Yi Zou, Zhuo Li, Charles J. Alpert, David Z. Pan:
Stitch aware detailed placement for multiple e-beam lithography. ASP-DAC 2016: 186-191
[c56]
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  - conf/iccad/LinYXGVL0AP16
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Yibo Lin, Bei Yu, Xiaoqing Xu, Jhih-Rong Gao, Natarajan Viswanathan, Wen-Hao Liu, Zhuo Li, Charles J. Alpert, David Z. Pan:
MrDP: multiple-row detailed placement of heterogeneous-sized cells for advanced nodes. ICCAD 2016: 7
2015
[j16]
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  - journals/tcad/YuXGL0AP15
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Bei Yu, Xiaoqing Xu, Jhih-Rong Gao, Yibo Lin, Zhuo Li, Charles J. Alpert, David Z. Pan:
Methodology for Standard Cell Compliance and Detailed Placement for Triple Patterning Lithography. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(5): 726-739 (2015)

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