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2010 – 2019
- 2019
[c9]Qihan Liu, Chun Zhao, Cezhou Zhao, Ivona Z. Mitrovic, Stephen Hall, Wangying Xu, Li Yang, Eng Gee Lim
, Q. N. Wang, Y. L. Wei, Yixin Cao:
Plasma-Enhanced Combustion-Processed Al2O3 Gate Oxide for In2O3 Thin Film Transistors. ICICDT 2019: 1-5- [c8]Tian Shi Zhao, Chun Zhao, C. Z. Zhao, Wangying Xu, Li Yang, Ivona Z. Mitrovic, Stephen Hall, Eng Gee Lim, S. C. Yu:
Solution Processed ZnSnO Thin-film Transistors with Peroxide- Aluminum Oxide Dielectric. ICICDT 2019: 1-4 - 2018
- [j3]Thomas Dowrick, Liam McDaid, Stephen Hall:
Fan-in analysis of a leaky integrator circuit using charge transfer synapses. Neurocomputing 314: 78-85 (2018) - 2014
- [c7]Olof Engström, Henryk M. Przewlocki, Ivona Z. Mitrovic, Stephen Hall:
Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties. ESSDERC 2014: 369-372 - 2011
- [c6]Stephen Hall:
Evolution of telco services utilising Infrastructure-as-a-Service (IaaS). ICIN 2011: 247-252 - 2010
- [b1]Stephen Hall:
An integrated fault tolerance framework for service oriented computing. Lancaster University, UK, 2010 - [j2]Enrique Acuña, Stephen Hall, Stephen Hardcastle, Lorrie Fava:
The Application of a MIP Model to Select the Optimum Auxiliary Fan and Operational Settings for Multiple Period Duties. INFOR Inf. Syst. Oper. Res. 48(2): 95-102 (2010) - [c5]Gerald Kotonya, Stephen Hall:
A Differentiation-Aware Fault-Tolerant Framework for Web Services. ICSOC 2010: 137-151
2000 – 2009
- 2007
- [c4]Stephen Hall, Gerald Kotonya:
An Adaptable Fault-Tolerance for SOA using a Peer-to-Peer Framework. ICEBE 2007: 520-527 - [c3]Glen Dobson, Stephen Hall, Gerald Kotonya:
A Domain-Independent Ontology for Non-Functional Requirements. ICEBE 2007: 563-566 - 2005
- [c2]Stephen Hall:
Case study for OZCHI 2005. OZCHI 2005 - [c1]Stephen Hall:
Predicting the effect of process time variability on annual production in a cell culture manufacturing facility. WSC 2005: 34 - 2001
- [j1]Andrew C. Lamb, J. F. W. Schiz, J. M. Bonar, Fuccio Cristiano, Peter Ashburn, Stephen Hall, Peter L. F. Hemment:
Characterisation of emitter/base leakage currents in SiGe HBTs produced using selective epitaxy. Microelectron. Reliab. 41(2): 273-279 (2001)
Coauthor Index
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