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ORCIDMichael J. Ohletz
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2000 – 2009
- 2009
[j4]Michael J. Ohletz, F. Schulze:
Design, qualification and production of integrated sensor interface circuits for high-quality automotive applications. Microelectron. J. 40(9): 1350-1357 (2009)- 2003
- [j3]Daniela De Venuto
, Michael J. Ohletz:
Floating body effects model for fault simulation of fully depleted CMOS/SOI circuits. Microelectron. J. 34(10): 889-895 (2003) - [c9]Daniela De Venuto, Michael J. Ohletz, Bruno Riccò:
Self-positioning digital window comparators for mixed-signal DfT. ETFA (1) 2003: 438-443 - [c8]Daniela De Venuto, Michael J. Ohletz, Bruno Riccò:
Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DfT Schemes. ISQED 2003: 431-437 - 2002
- [j2]Daniela De Venuto, Michael J. Ohletz, Bruno Riccò:
Digital Window Comparator DfT Scheme for Mixed-Signal ICs. J. Electron. Test. 18(2): 121-128 (2002) - [c7]Daniela De Venuto, Michael J. Ohletz, Bruno Riccò:
Testing of Analogue Circuits via (Standard) Digital Gates. ISQED 2002: 112-119 - 2001
- [j1]Daniela De Venuto, Michael J. Ohletz:
On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages. J. Electron. Test. 17(3-4): 243-253 (2001) - 2000
- [c6]Daniela De Venuto, Michael J. Ohletz, G. Matarrese:
Static and dynamic on-chip test response evaluation using a two-mode comparator. ETW 2000: 47-52
1990 – 1999
- 1998
- [c5]Marcelino B. Santos, Fernando M. Gonçalves, Michael J. Ohletz, João Paulo Teixeira:
Defect-oriented testing of analogue and mixed signal ICs. ICECS 1998: 419-424 - [c4]Andreas Lechner, Andrew Richardson, B. Hermes, Michael J. Ohletz:
A Design for Testability Study on a High Performance Automatic Gain Control Circuit. VTS 1998: 376-385 - 1996
- [c3]Michael J. Ohletz:
Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits. ITC 1996: 776-785 - 1995
- [c2]Christian Sebeke, J. P. Teixeira, Michael J. Ohletz:
Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits. ED&TC 1995: 464-468
1980 – 1989
- 1985
- [c1]F. Matthiesen, Michael J. Ohletz:
Test of Digital Transversal Filters. ITC 1985: 842-847
Coauthor Index
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