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Conference and Workshop Papers
- 2023
[c18]Francesco Angione
, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre:
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS 2023: 1-6- 2022
- [c17]Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An innovative Strategy to Quickly Grade Functional Test Programs. ITC 2022: 355-364 - 2021
- [c16]Annachiara Ruospo, Davide Piumatti, Andrea Floridia, Ernesto Sánchez:
A Suitability Analysis of Software Based Testing Strategies for the On-line Testing of Artificial Neural Networks Applications in Embedded Devices. IOLTS 2021: 1-6 - 2020
- [c15]Andrea Floridia, Tzamn Melendez Carmona, Davide Piumatti, Annachiara Ruospo, Ernesto Sánchez, Sergio de Luca, Rosario Martorana, Mose Alessandro Pernice:
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips. DATE 2020: 1235-1240 - [c14]Davide Piumatti, Matteo Vincenzo Quitadamo, Matteo Sonza Reorda, Franco Fiori:
Testing Heatsink Faults in Power Transistors by means of Thermal Model. LATS 2020: 1-6 - 2019
- [c13]Paolo Bernardi, Riccardo Cantoro, Andrea Floridia, Davide Piumatti, C. Pogonea, Annachiara Ruospo, Ernesto Sánchez, Sergio de Luca, Alessandro Sansonetti:
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions. DATE 2019: 920-923 - [c12]Davide Piumatti, Stefano Borlo, Fabio Mandrile, Matteo Sonza Reorda, Radu Bojoi:
Assessing the Effectiveness of the Test of Power Devices at the Board Level. DCIS 2019: 1-6 - [c11]Andrea Floridia, Gianmarco Mongano, Davide Piumatti, Ernesto Sánchez:
Hybrid on-line self-test architecture for computational units on embedded processor cores. DDECS 2019: 1-6 - [c10]Cemil Cem Gürsoy, Maksim Jenihhin, Adeboye Stephen Oyeniran, Davide Piumatti, Jaan Raik, Matteo Sonza Reorda, Raimund Ubar:
New categories of Safe Faults in a processor-based Embedded System. DDECS 2019: 1-4 - [c9]Andrea Floridia, Davide Piumatti, Annachiara Ruospo, Ernesto Sánchez, Sergio de Luca, Rosario Martorana:
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips. ITC 2019: 1-10 - [c8]Paolo Bernardi, Davide Piumatti, Ernesto Sánchez:
Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool. LASCAS 2019: 77-80 - 2018
- [c7]Davide Piumatti, Matteo Sonza Reorda:
Assessing Test Procedure Effectiveness for Power Devices. DCIS 2018: 1-6 - [c6]Andrea Floridia, Davide Piumatti, Ernesto Sánchez, Sergio de Luca, Alessandro Sansonetti:
Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers. DTIS 2018: 1-6 - [c5]Riccardo Cantoro, Andrea Firrincieli, Davide Piumatti, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda:
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications. LATS 2018: 1-6 - 2017
- [c4]Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner:
Robustness in automotive electronics: An industrial overview of major concerns. IOLTS 2017: 157-162 - [c3]Paolo Bernardi, Sergio de Luca, Davide Piumatti, S. Regis, Ernesto Sánchez, Alessandro Sansonetti:
On the in-field testing of spare modules in automotive microprocessors. VLSI-SoC 2017: 1-6 - 2016
- [c2]Riccardo Cantoro, Davide Piumatti, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti:
In-field functional test programs development flow for embedded FPUs. DFT 2016: 107-110 - 2015
- [c1]Paolo Bernardi, C. Bovi, Riccardo Cantoro, Sergio de Luca, Renato Meregalli, Davide Piumatti, Ernesto Sánchez, Alessandro Sansonetti:
Software-based self-test techniques of computational modules in dual issue embedded processors. ETS 2015: 1-2
Informal and Other Publications
- 2020
- [i1]Cemil Cem Gürsoy, Maksim Jenihhin, Adeboye Stephen Oyeniran, Davide Piumatti, Jaan Raik, Matteo Sonza Reorda, Raimund Ubar:
New categories of Safe Faults in a processor-based Embedded System. CoRR abs/2009.11621 (2020)
Coauthor Index
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