Shin-ichiro Abe

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

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Publications

2023
[c4]
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Kazusa Takami, Yuibi Gomi, Shin-ichiro Abe, Wang Liao, Seiya Manabe, Tetsuro Matsumoto, Masanori Hashimoto:
Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons. IRPS 2023: 1-6
2020
[c3]
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  - conf/irps/AbeSKMWLIHHOM20
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Shin-ichiro Abe, Tatsuhiko Sato, Junya Kuroda, Seiya Manabe, Yukinobu Watanabe, Wang Liao, Kojiro Ito, Masanori Hashimoto, Masahide Harada, Kenichi Oikawa, Yasuhiro Miyake:
Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets. IRPS 2020: 1-7
2019
[j1]
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  - journals/integration/HashimotoKFAW19
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Masanori Hashimoto, Kazutoshi Kobayashi, Jun Furuta, Shin-ichiro Abe, Yukinobu Watanabe:
Characterizing SRAM and FF soft error rates with measurement and simulation. Integr. 69: 161-179 (2019)
[c2]
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  - conf/irps/LiaoHMWANTTTM19
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Wang Liao, Masanori Hashimoto, Seiya Manabe, Yukinobu Watanabe, Shin-ichiro Abe, Keita Nakano, Hayato Takeshita, Motonobu Tampo, Soshi Takeshita, Yasuhiro Miyake:
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs. IRPS 2019: 1-5
2015
[c1]
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  - conf/irps/MoriUMAW15
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Hiroko Mori, Taiki Uemura, Hideya Matsuyama, Shin-ichiro Abe, Yukinobu Watanabe:
Critical charge dependence of correlation of different neutron sources for soft error testing. IRPS 2015: 2

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