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Journal Articles
- 2016
[j4]Hao Zou
, Yasser Moursy, Ramy Iskander, Alexander Steinmair, Heimo Gensinger, Ehrenfried Seebacher, Jean-Paul Chaput, Marie-Minerve Louërat:
Using CAD Tool for Substrate Parasitic Modeling in Smart Power Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(12): 2323-2333 (2016)- 2011
- [j3]Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser:
An analytical approach for physical modeling of hot-carrier induced degradation. Microelectron. Reliab. 51(9-11): 1525-1529 (2011) - 2010
- [j2]Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser:
Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectron. Reliab. 50(9-11): 1267-1272 (2010) - 2008
- [j1]Martin Schrems, Martin Knaipp, Hubert Enichlmair, Verena Vescoli, Rainer Minixhofer, Ehrenfried Seebacher, Friedrich Peter Leisenberger, Ewald Wachmann, Gregor Schatzberger, Heimo Gensinger:
Scalable High Voltage CMOS technology for Smart Power and sensor applications. Elektrotech. Informationstechnik 125(4): 109-117 (2008)
Conference and Workshop Papers
- 2017
- [c3]Mitiko Miura-Mattausch, Hidenori Miyamoto, Hideyuki Kikuchihara, Dondee Navarro, Tapas K. Maiti, Nezam Rohbani, C. Ma, Hans Jürgen Mattausch, A. Schiffmann, Alexander Steinmair, Ehrenfried Seebacher:
Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits. ESSDERC 2017: 192-195 - 2016
- [c2]Yasser Moursy, Hao Zou, Ramy Iskander, Pierre Tisserand, Dieu-My Ton, Giuseppe Pasetti, Ehrenfried Seebacher, Alexander Steinmair, Thomas Gneiting, Heidrun Alius:
Towards automatic diagnosis of minority carriers propagation problems in HV/HT automotive smart power ICs. DATE 2016: 265-268 - [c1]Camillo Stefanucci, Pietro Buccella, Ehrenfried Seebacher, Alexander Steinmair, Maher Kayal, Jean-Michel Sallese:
Analysis of substrate currents propagation in HVCMOS technology. ESSDERC 2016: 319-322
Coauthor Index
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