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ORCIDYgor Aguiar
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2020 – today
- 2020
[c6]S. Guagliardo, Frederic Wrobel
, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul:
Effect of Temperature on Single Event Latchup Sensitivity. DTIS 2020: 1-5
2010 – 2019
- 2018
- [j4]Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget:
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. 88-90: 920-924 (2018) - 2017
- [j3]Walter E. Calienes Bartra, Y. Q. de Aguiar, Cristina Meinhardt, Andrei Vladimirescu, Ricardo Augusto da Luz Reis:
Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. Microelectron. Reliab. 76-77: 655-659 (2017) - [j2]Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis:
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology. Microelectron. Reliab. 76-77: 660-664 (2017) - [c5]Ygor Q. Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis:
Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices. ICECS 2017: 270-273 - [c4]Y. Q. de Aguiar, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis:
SET response of FinFET-based majority voter circuits under work-function fluctuation. ICECS 2017: 282-285 - [c3]Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis:
Robustness of Sub-22nm multigate devices against physical variability. ISCAS 2017: 1-4 - [c2]Ygor Q. de Aguiar, Cristina Meinhardt, Ricardo A. L. Reis:
Radiation sensitivity of XOR topologies in multigate technologies under voltage variability. LASCAS 2017: 1-4 - 2016
- [j1]Y. Q. de Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis:
Permanent and single event transient faults reliability evaluation EDA tool. Microelectron. Reliab. 64: 63-67 (2016) - [c1]Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis:
Geometric variability impact on 7nm Trigate combinational cells. ICECS 2016: 9-12
Coauthor Index
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