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Lavanya Jagan

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Conference and Workshop Papers

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2010
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Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti:
Impact of Temperature on Test Quality. VLSI Design 2010: 276-281
2009
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Lavanya Jagan, Ratan Deep Singh, V. Kamakoti, Ananta K. Majhi:
Efficient Grouping of Fail Chips for Volume Yield Diagnostics. VLSI Design 2009: 97-102

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