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Thomas Mazeaud

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2010 – 2019

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2014
[j3]
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Donatien Martineau, Colette Levade, Marc Legros, Philippe Dupuy, Thomas Mazeaud:
Universal mechanisms of Al metallization ageing in power MOSFET devices. Microelectron. Reliab. 54(11): 2432-2439 (2014)
2010
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Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade:
Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. Microelectron. Reliab. 50(9-11): 1768-1772 (2010)

2000 – 2009

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2009
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Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade, G. Vanderschaeve:
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. Microelectron. Reliab. 49(9-11): 1330-1333 (2009)

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