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Lynne M. Gignac
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2020 – today
- 2024
- [c6]H. Y. Cheng, Z. L. Liu, A. Majumdar, Alexander Grun, A. Ray, J. Su, Malte J. Rasch, Fabio Carta, Lynne M. Gignac, C. Lavoie, C. W. Cheng, M. Bright Sky, H. L. Lung:
State-Independent Low Resistance Drift SiSbTe Phase Change Memory for Analog In-Memory Computing Applications. VLSI Technology and Circuits 2024: 1-2 - [c5]Wei-Chih Chien, J. X. Zheng, C. W. Yeh, Lynne M. Gignac, H. Y. Cheng, Z. L. Liu, Alexander Grun, C. L. Sung, E. K. Lai, S. Cheng, C. W. Cheng, L. Buzi, A. Ray, Douglas M. Bishop, Robert L. Bruce, M. J. BrightSky, H. L. Lung:
A Novel Chalcogenide Based CuGeSe Selector Only Memory (SOM) for 3D Xpoint and 3D Vertical Memory Applications. VLSI Technology and Circuits 2024: 1-2 - 2023
- [c4]Wei-Chih Chien, E. K. Lai, L. Buzi, C. W. Cheng, C. W. Yeh, A. Ray, Lynne M. Gignac, N. Gong, Huai-Yu Cheng, Alexander Grun, D. Y. Lee, W. Kim, A. Majumdar, Douglas M. Bishop, Robert L. Bruce, D. Daudelin, H. Y. Ho, M. J. BrightSky, H. L. Lung:
A Comprehensive Study on the Pillar Size of OTS-PCM Memory with an Optimized Process and Scaling Trends Down to Sub-10 nm for SCM Applications. IMW 2023: 1-4 - 2022
- [c3]Wei-Chih Chien, Lynne M. Gignac, Y. C. Chou, C. H. Yang, N. Gong, H. Y. Ho, C. W. Yeh, H. Y. Cheng, W. Kim, I. T. Kuo, E. K. Lai, C. W. Cheng, L. Buzi, A. Ray, Chia-Sheng Hsu, Robert L. Bruce, Matthew BrightSky, H. L. Lung:
Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme. IRPS 2022: 7-1 - 2021
- [c2]Robert L. Bruce, Syed Ghazi Sarwat, Irem Boybat, Cheng-Wei Cheng, Wanki Kim, S. R. Nandakumar, Charles Mackin, Timothy Philip, Zuoguang Liu, Kevin Brew, Nanbo Gong, Injo Ok, Praneet Adusumilli, Katie Spoon, Stefano Ambrogio, Benedikt Kersting, Thomas Bohnstingl, Manuel Le Gallo, Andrew Simon, Ning Li, Iqbal Saraf, Jin-Ping Han, Lynne M. Gignac, John M. Papalia, Tenko Yamashita, Nicole Saulnier, Geoffrey W. Burr, Hsinyu Tsai, Abu Sebastian, Vijay Narayanan, Matthew BrightSky:
Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation. IRPS 2021: 1-6
2010 – 2019
- 2018
- [c1]Chao-Kun Hu, James J. Kelly, Huai Huang, Koichi Motoyama, Hosadurga Shobha, Yuri Ostrovski, James H.-C. Chen, Raghuveer Patlolla, Brown Peethala, Praneet Adusumilli, Terry A. Spooner, Roger Quon, Lynne M. Gignac, Chris M. Breslin, G. Lian, M. Ali, Jacob Benedict, X. S. Lin, S. Smith, Vimal Kamineni, X. Zhang, Frank Wilhelm Mont, Shariq Siddiqui, Frieder H. Baumann:
Future on-chip interconnect metallization and electromigration. IRPS 2018: 4
2000 – 2009
- 2006
- [j1]Chao-Kun Hu, Lynne M. Gignac, R. Rosenberg:
Electromigration of Cu/low dielectric constant interconnects. Microelectron. Reliab. 46(2-4): 213-231 (2006)
Coauthor Index
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