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Moon-Hyun Yoo
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Journal Articles
- 2010
- [j2]Soo-Han Choi, Young Hee Park, Chul-Hong Park, Sang Hoon Lee, Moon-Hyun Yoo, Jun Dong Cho
, Gyu Tae Kim:
Suppression of Edge Effects Based on Analytic Model for Leakage Current Reduction of Sub-40 nm DRAM Device. IEICE Trans. Electron. 93-C(5): 658-661 (2010) - 2009
- [j1]Yonghee Park, Junghoe Choi, Jisuk Hong, Sanghoon Lee, Moon-Hyun Yoo, Jundong Cho
:
Accurate Systematic Hot-Spot Scoring Method and Score-Based Fixing Guidance Generation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(12): 3082-3085 (2009)
Conference and Workshop Papers
- 2008
- [c8]Young-Gu Kim, Soo-Hwan Kim, Hoon Lim, Sanghoon Lee, Keun-Ho Lee, Young-Kwan Park, Moon-Hyun Yoo:
The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. ISQED 2008: 369-372 - 2007
- [c7]Jeong-Yeol Kim, Ho-Soon Shin, Jong-Bae Lee, Moon-Hyun Yoo, Jeong-Taek Kong:
SilcVerify: An Efficient Substrate Coupling Noise Simulation Tool for High-Speed & Nano-Scaled Memory Design. ISQED 2007: 475-480 - 2005
- [c6]Yong-Chan Ban, Soo-Han Choi, Ki-Hung Lee, Dong-Hyun Kim, Jisuk Hong, Yoo-Hyon Kim, Moon-Hyun Yoo, Jeong-Taek Kong:
A Fast Lithography Verification Framework for Litho-Friendly Layout Design. ISQED 2005: 169-174 - [c5]Young-Seok Hong, Heeseok Lee, Joon-Ho Choi, Moon-Hyun Yoo, Jeong-Taek Kong:
Analysis for Complex Power Distribution Networks Considering Densely Populated Vias. ISQED 2005: 208-212 - 2004
- [c4]Jong-Eun Koo, Kyung-Ho Lee, Young-Hoe Cheon, Joon-Ho Choi, Moon-Hyun Yoo, Jeong-Taek Kong:
A Variable Reduction Technique for the Analysis of Ultra Large-Scale Power Distribution Networks. ISQED 2004: 137-142 - 2003
- [c3]Jae-Seok Yang, Jeong-Yeol Kim, Joon-Ho Choi, Moon-Hyun Yoo, Jeong-Taek Kong:
Elimination of false aggressors using the functional relationship for full-chip crosstalk analysis. ISQED 2003: 344-347 - 2002
- [c2]Chul-Hong Park, Soo-Han Choi, Sang-Uhk Rhie, Dong-Hyun Kim, Jun-Seong Park, Tae-Hwang Jang, Ji-Soong Park, Yoo-Hyon Kim, Moon-Hyun Yoo, Jeong-Taek Kong:
A Hybrid PPC Method Based on the Empirical Etch Model for the 0.14µm DRAM Generation and Beyond. ISQED 2002: 143-147 - 2000
- [c1]Ji-Soong Park, Chul-Hong Park, Sang-Uhk Rhie, Yoo-Hyon Kim, Moon-Hyun Yoo, Jeong-Taek Kong, Hyung-Woo Kim, Sun-Il Yoo:
An Efficient Rule-Based OPC Approach Using a DRC Tool for 0.18mum ASIC. ISQED 2000: 81-86
Coauthor Index
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