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Shu-Kai S. Fan
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2020 – today
- 2024
- [j23]Biswajit Sarkar, Shu-Kai S. Fan, Sarla Pareek, Bablu Mridha:
Sustainable multi-biofuel production with stochastic lead time and optimum energy utilization under flexible manufacturing. Comput. Ind. Eng. 193: 110223 (2024) - 2023
- [c4]Chih-Hung Jen, Shu-Kai S. Fan, Kun-Mu Lu, Ching-Wen Huang, Ju-Ling Hsiao, Yu-Zhi Zheng, Yi-Jun Cai:
Using the Concept of Generative Adversarial Network (GAN) to Strengthen the Classification Performance for X-ray Images of Small Samples. ICMHI 2023: 297-302 - 2022
- [j22]Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Mabel C. Chou, Chih-Hung Jen, Jen-Hsuan Tsou:
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 19(3): 1530-1541 (2022) - [j21]Shu-Kai S. Fan, Chun-Wei Cheng, Du-Ming Tsai:
Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes. IEEE Trans Autom. Sci. Eng. 19(4): 3068-3082 (2022) - [j20]Shu-Kai S. Fan, Xiao-Wen Chang, Yu-Yu Lin:
Product-to-Product Virtual Metrology of Color Filter Processes in Panel Industry. IEEE Trans Autom. Sci. Eng. 19(4): 3496-3507 (2022) - [j19]Chih-Hung Jen, Shu-Kai S. Fan, Yu-Yu Lin:
Data-Driven Virtual Metrology and Retraining Systems for Color Filter Processes of TFT-LCD Manufacturing. IEEE Trans. Instrum. Meas. 71: 1-12 (2022) - 2021
- [j18]Shu-Kai S. Fan, Chih-Hung Jen, Chia-Yu Hsu, Yu-Ling Liao:
A New Double Exponentially Weighted Moving Average Run-to-Run Control Using a Disturbance-Accumulating Strategy for Mixed-Product Mode. IEEE Trans Autom. Sci. Eng. 18(4): 1846-1860 (2021) - [j17]Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou:
Auto-Annotated Deep Segmentation for Surface Defect Detection. IEEE Trans. Instrum. Meas. 70: 1-10 (2021) - 2020
- [j16]Shu-Kai S. Fan, Chia-Yu Hsu, Chih-Hung Jen, Kuan-Lung Chen, Li-Ting Juan:
Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes. Adv. Eng. Informatics 46: 101166 (2020) - [j15]Shu-Kai S. Fan, Chia-Yu Hsu, Chih-Hung Jen, Kuan-Lung Chen, Li-Ting Juan:
Corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166]. Adv. Eng. Informatics 46: 101178 (2020) - [j14]Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fei He, Chun-Chung Cheng:
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 17(4): 1925-1936 (2020)
2010 – 2019
- 2018
- [j13]Shu-Kai S. Fan, Chuan-Jun Su, Han-Tang Nien, Pei-Fang Tsai, Chen-Yang Cheng:
Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection. Soft Comput. 22(17): 5707-5718 (2018) - 2014
- [j12]Chui-Yu Chiu, Shu-Kai S. Fan, Po-Chou Shih, Yi-Hsin Weng:
Applying HBMO-based SOM in Predicting the Taiwan Steel Price Fluctuation. Int. J. Electron. Bus. Manag. 12(1) (2014) - 2013
- [j11]Shu-Kai S. Fan, Yuan-Jung Chang, Nafy Aidara:
Nonlinear Profile Monitoring of Reflow Process Data Based on the Sum of Sine Functions. Qual. Reliab. Eng. Int. 29(5): 743-758 (2013) - [j10]Shu-Kai S. Fan, Hui-Kuo Huang, Yuan-Jung Chang:
Robust Multivariate Control Chart for Outlier Detection Using Hierarchical Cluster Tree in SW2. Qual. Reliab. Eng. Int. 29(7): 971-985 (2013) - [c3]Shu-Kai S. Fan, Yu-Chiang Chuang:
An Entropy-based Method for Color Image Registration. VISAPP (1) 2013: 417-421 - 2012
- [j9]Shu-Kai S. Fan, Yu-Chiang Chuang:
An entropy-based image registration method using image intensity difference on overlapped region. Mach. Vis. Appl. 23(4): 791-804 (2012) - 2010
- [j8]Shu-Kai S. Fan, Yu-Chiang Chuang:
Automatic detection of Mura defect in TFT-LCD based on regression diagnostics. Pattern Recognit. Lett. 31(15): 2397-2404 (2010) - [c2]Shu-Kai S. Fan, Yu-Chiang Chuang:
A New Image Registration Method Using Intensity Difference Data on Overlapped Image. UIC/ATC Workshops 2010: 138-141
2000 – 2009
- 2009
- [j7]Shu-Kai S. Fan, Yen Lin:
A fast estimation method for the generalized Gaussian mixture distribution on complex images. Comput. Vis. Image Underst. 113(7): 839-853 (2009) - 2008
- [j6]Shu-Kai S. Fan, Yen Lin, Chia-Chan Wu:
Image thresholding using a novel estimation method in generalized Gaussian distribution mixture modeling. Neurocomputing 72(1-3): 500-512 (2008) - 2007
- [j5]Shu-Kai S. Fan, Yen Lin:
Multiple-input dual-output adjustment scheme for semiconductor manufacturing processes using a dynamic dual-response approach. Eur. J. Oper. Res. 180(2): 868-884 (2007) - [j4]Shu-Kai S. Fan, Erwie Zahara:
A hybrid simplex search and particle swarm optimization for unconstrained optimization. Eur. J. Oper. Res. 181(2): 527-548 (2007) - [j3]Shu-Kai S. Fan, Yen Lin:
A multi-level thresholding approach using a hybrid optimal estimation algorithm. Pattern Recognit. Lett. 28(5): 662-669 (2007) - [c1]Shu-Kai S. Fan, Ju-Ming Chang:
A Modified Particle Swarm Optimizer Using an Adaptive Dynamic Weight Scheme. HCI (12) 2007: 56-65 - 2006
- [j2]Shu-Kai S. Fan, Yun-Chia Liang, Erwie Zahara:
A genetic algorithm and a particle swarm optimizer hybridized with Nelder-Mead simplex search. Comput. Ind. Eng. 50(4): 401-425 (2006) - 2005
- [j1]Erwie Zahara, Shu-Kai S. Fan, Du-Ming Tsai:
Optimal multi-thresholding using a hybrid optimization approach. Pattern Recognit. Lett. 26(8): 1082-1095 (2005)
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