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M. Palaniappan

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2000 – 2009

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2003
[j2]
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J. C. H. Phang, D. S. H. Chan, V. K. S. Ong, S. Kolachina, J. M. Chin, M. Palaniappan, G. Gilfeather, Y. X. Seah:
Single contact beam induced current phenomenon for microelectronic failure analysis. Microelectron. Reliab. 43(9-11): 1595-1602 (2003)
2001
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J. M. Chin, J. C. H. Phang, D. S. H. Chan, M. Palaniappan, G. Gilfeather, C. E. Soh:
Single contact optical beam induced currents. Microelectron. Reliab. 41(8): 1237-1242 (2001)

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