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P. Kouaté Wafo

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2025
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Abygaël Viey, William Vandendaele, P. Kouaté Wafo, Xavier Garros, Luigi Basset, F. Ponthenier, Joris Lacord, R. Fillon, X. Federspiel, D. Roy, S. Joblot, Dominique Golanski:
Influence of Process Integration on pBTI Degradation in Analog SOI nMOSFETs. IRPS 2025: 1-6

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