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Alan Hales
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2010 – 2019
- 2017
- [c7]Jing Lu, Alan Hales, David Rew:
Modelling of Cancer Patient Records: A Structured Approach to Data Mining and Visual Analytics. ITBAM 2017: 30-51 - 2016
- [c6]Jing Lu, Alan Hales, David Rew, Malcolm Keech:
Timeline and episode-structured clinical data: Pre-processing for Data Mining and analytics. ICDE Workshops 2016: 64-67 - 2015
- [c5]Jing Lu, Alan Hales, David Rew, Malcolm Keech, Christian Fröhlingsdorf, Alex Mills-Mullett, Christian Wette:
Data Mining Techniques in Health Informatics: A Case Study from Breast Cancer Research. ITBAM 2015: 56-70 - 2012
- [c4]Raguram Damodaran, Timothy Anderson, Sanjive Agarwala, Rama Venkatasubramanian, Michael Gill, Dhileep Gopalakrishnan, Anthony M. Hill, Abhijeet Chachad, Dheera Balasubramanian, Naveen Bhoria, Jonathan Tran, Duc Bui, Mujibur Rahman, Shriram Moharil, Matthew Pierson, Steven Mullinnix, Hung Ong, David Thompson, Krishna Gurram, Oluleye Olorode, Nuruddin Mahmood, Jose Flores, Arjun Rajagopal, Soujanya Narnur, Daniel Wu, Alan Hales, Kyle Peavy, Robert Sussman:
A 1.25GHz 0.8W C66x DSP Core in 40nm CMOS. VLSI Design 2012: 286-291 - 2010
- [c3]V. R. Devanathan, Alan Hales, Sumant Kale, Dharmesh Sonkar:
Towards effective and compression-friendly test of memory interface logic. ITC 2010: 124-133
2000 – 2009
- 2007
- [c2]Sanjive Agarwala, Arjun Rajagopal, Anthony M. Hill, Mayur Joshi, Steven Mullinnix, Timothy Anderson, Raguram Damodaran, Lewis Nardini, Paul Wiley, Peter Groves, John Apostol, Michael Gill, Jose Flores, Abhijeet Chachad, Alan Hales, Kai Chirca, Krishna Panda, Rama Venkatasubramanian, Patrick Eyres, Rajasekhar Velamuri, Anand Rajaram, Manjeri Krishnan, Jonathan Nelson, Jose Frade, Mujibur Rahman, Nuruddin Mahmood, Usha Narasimha, Snehamay Sinha, Sridhar Krishnan, William Webster, Duc Bui, Shriram Moharil, Neil Common, Rejitha Nair, Rajesh Ramanujam, Monica Ryan:
A 65nm C64x+ Multi-Core DSP Platform for Communications Infrastructure. ISSCC 2007: 262-601
1990 – 1999
- 1995
- [j1]Keith Baker, Alan Hales:
Plug-and-Play IDDQ Testing for Test Fixtures. IEEE Des. Test Comput. 12(3): 53-61 (1995) - 1994
- [c1]Alan Hales:
A Serially Addressable, Flexible Current Monitor for Test Fixture Based IDDQ/ISSQ Testing. ITC 1994: 223-232
Coauthor Index
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