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John E. McDermid

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affiliation: Hewlett Packard Company, Loveland, CO, USA

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1990 – 1999

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1998
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John E. McDermid:
Limited access testing: IEEE 1149.4-instrumentation and methods. ITC 1998: 388-395
1997
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Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa:
Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498
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Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater:
Will 0.1um Digital Circuits Require Mixed-Signal Testing. VTS 1997: 186-187
1993
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Kenneth P. Parker, John E. McDermid, Stig Oresjo:
Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322

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