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Joe Swenton

Joseph Swenton

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Journal Articles

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2024
[j2]
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Zhan Gao, Min-Chun Hu, Rogier Baert, Bilal Chehab, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology. IEEE Des. Test 41(2): 56-64 (2024)
2021
[j1]
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Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality. J. Electron. Test. 37(2): 161-189 (2021)

Conference and Workshop Papers

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2021
[c11]
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Francesco Lorenzelli, Zhan Gao, Joe Swenton, Santosh Malagi, Erik Jan Marinissen:
Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis. ETS 2021: 1-6
2020
[c10]
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Min-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen:
Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults. ETS 2020: 1-6
2019
[c9]
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Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen:
Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library. ITC 2019: 1-6
[c8]
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Zhan Gao, Min-Chun Hu, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices. ITC-Asia 2019: 91-96
[c7]
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Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken, Kees Goossens:
Defect-Location Identification for Cell-Aware Test. LATS 2019: 1-6
2018
[c6]
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  - conf/itc/ChillarigeCMNSC18
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Sameer Chillarige, Atul Chhabra, Anil Malik, Bharath Nandakumar, Joe Swenton, Krishna Chakravadhanula:
Improving Diagnosis Resolution and Performance at High Compression Ratios. ITC 2018: 1-8
2017
[c5]
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Sameer Chillarige, Anil Malik, Sharjinder Singh, Joe Swenton, Krishna Chakravadhanula:
High throughput multiple device diagnosis system. ITC 2017: 1-10
2015
[c4]
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  - conf/natw/ChillarigeVMCCS15
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Sameer Chillarige, S. Virdi, Anil Malik, Krishna Chakravadhanula, Vivek Chickermane, Joe Swenton, G. Vandling:
A Novel Failure Diagnosis Approach for Low Pin Count and Low Power Compression Architectures. NATW 2015: 43-48
2000
[c3]
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  - conf/itc/ButlerKPSS00
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Robert Butler, Brion L. Keller, Sarala Paliwal, Richard Schoonover, Joseph Swenton:
Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count. ITC 2000: 530-537
1999
[c2]
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  - conf/ats/ChenSSW99
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Xinghao Chen, Thomas J. Snethen, Joe Swenton, Ron Walther:
A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor. Asian Test Symposium 1999: 321-326
1998
[c1]
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  - conf/itc/KellerMSY98
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Brion L. Keller, Kevin McCauley, Joseph Swenton, James Youngs:
ATPG in practical and non-traditional applications. ITC 1998: 632-640

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