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Journal of Electronic Testing, Volume 37
Volume 37, Number 1, February 2021
- Vishwani D. Agrawal:
Editorial. 1-2 - 2020 JETTA Reviewers. 3-4
- Test Technology Newsletter. 5-6
- Umer Farooq
, Habib Mehrez:
Pre-Silicon Verification Using Multi-FPGA Platforms: A Review. 7-24 - Prattay Chowdhury, Ujjwal Guin
, Adit D. Singh, Vishwani D. Agrawal:
Estimating Operational Age of an Integrated Circuit. 25-40 - Sabyasachi Deyati
, Barry J. Muldrey, Adit D. Singh, Abhijit Chatterjee:
High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems. 41-63 - Karthik Pandaram
, S. Rathnapriya, V. Manikandan:
Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm. 83-96 - Xijun Huang, Chuan-pei Xu
, Long Zhang:
On-Line Test of Pin-Constrained Digital Microfluidic Biochips with Connect-5 Structure. 97-107 - Sourav Ghosh, Surajit Kumar Roy, Chandan Giri:
Testing and Diagnosis of Digital Microfluidic Biochips using Multiple Droplets. 109-126 - Mengru Wang, Jinbo Wang
, Jianmin Wang, Shan Zhou:
Single Particle Fault Injection Signal Generation Method Using Gaussian Cloud Model. 127-140 - Yindong Xiao
, XueQian Huang, Ke Liu:
Model Transferability from ImageNet to Lithography Hotspot Detection. 141-149 - Partha Mitra
, Jaydeb Bhaumik, Angsuman Sarkar:
Decoupling Capacitor Estimation and Allocation using Optimization Techniques for Power Supply Noise Reduction in System-on-Chip. 151-155
Volume 37, Number 2, April 2021
- Vishwani D. Agrawal:
Editorial. 157-158 - Test Technology Newsletter. 159-160
- Zhan Gao
, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken
, Kees Goossens, Erik Jan Marinissen
:
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality. 161-189 - Vasileios Gerakis
, Yiorgos Tsiatouhas, Alkis A. Hatzopoulos:
A Low-Cost, Robust and Tolerant, Digital Scheme for Post-Bond Testing and Diagnosis of TSVs. 191-203 - Wang-Dauh Tseng
:
A Cascaded Multicasting Architecture for Test Data Compression. 205-214 - Lu Sun
, Yang Li, Han Du, Peipei Liang, Fushun Nian:
Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov Model. 215-223 - Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. 225-242 - Muhammad Sheikh Sadi
, Sumaiya Sumaiya, Mouly Dewan, Md. Atikur Rahman:
Tolerating Soft Errors with Horizontal-Vertical-Diagonal-N-Queen (HVDNQ) Parity. 243-254 - JianAn Wang, Xue Wu, Haonan Tian
, Lixiang Li, Shuting Shi, Li Chen
:
Radiation Tolerant SRAM Cell Design in 65nm Technology. 255-262 - Cleiton Magano Marques
, Cristina Meinhardt
, Paulo Francisco Butzen
:
Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions. 263-270 - Shuting Shi
, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian
, Li Chen
:
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. 271-278 - Lijun Liu
, Tao Wang, Xiaohan Wang:
Method of Implanting Hardware Trojan Based on EHW in Part of Circuit. 279-284
Volume 37, Number 3, June 2021
- Vishwani D. Agrawal:
Editorial. 285-286 - Test Technology Newsletter. 287-288
- Ievgen Kabin, Zoya Dyka, Dan Klann, Marcin Aftowicz, Peter Langendoerfer:
Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice. 289-303 - Yonghong Bai
, Zhiyuan Yan:
A Secure and Robust PUF-based Key Generation with Wiretap Polar Coset Codes. 305-316 - Anindan Mondal
, Rajesh Kumar Biswal, Mahabub Hasan Mahalat
, Suchismita Roy
, Bibhash Sen
:
Hardware Trojan Free Netlist Identification: A Clustering Approach. 317-328 - Carlos J. González
, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas
, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli
, Tiago Roberto Balen:
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. 329-343 - Mahamat Issa Boukhari
, Djiddo Ali Oumar, Stéphane Capraro, D. Piétroy, J. P. Chatelon, Jean Jacques Rousseau:
Measurement and Simulation of the Near Magnetic Field Radiated by Integrated Magnetic Inductors. 345-355 - S. Herasimov, M. Borysenko, E. Roshchupkin, Volodymyr I. Hrabchak, Yuriy A. Nastishin
:
Spectrum Analyzer Based on a Dynamic Filter. 357-368 - Víctor H. Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas:
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell. 369-382 - Thiago Copetti
, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen:
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. 383-394 - Masoumeh Taali, Zahra Shirmohammadi
:
A Numeral System Based Framework for Improved One-Lambda Crosstalk Avoidance Code Using Recursive Symmetry Formula. 395-408 - Felix Loh
, Kewal K. Saluja, Parameswaran Ramanathan:
Fault Tolerant Lanczos Eigensolver via an Invariant Checking Method. 409-422
Volume 37, Number 4, August 2021
- Vishwani D. Agrawal:
Editorial. 423-424 - Test Technology Newsletter. 425-426
- Letícia Maria Veiras Bolzani
, Moritz Fieback
, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke
:
Review of Manufacturing Process Defects and Their Effects on Memristive Devices. 427-437 - Milos Milovancevic, Aleksandar Dimov, Kamen Boyanov Spasov, Ljubomir Vracar, Miroslav Planic:
Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System. 439-452 - Tsai-Chieh Chen, Chia-Cheng Pai, Yi-Zhan Hsieh, Hsiao-Yin Tseng, Chien-Mo James Li, Tsung-Te Liu, I-Wei Chiu
:
Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits. 453-471 - Mahshid Tebyanian, Azadeh Mokhtarpour, Alireza Shafieinejad
:
SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier. 473-487 - Aibin Yan
, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications. 489-502 - Shyue-Kung Lu
, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun:
Fault-Aware Dependability Enhancement Techniques for Phase Change Memory. 503-513 - Hussein Bazzi
, Hassen Aziza, Mathieu Moreau
, Adnan Harb:
Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability. 515-532 - Marco Grossi
, Martin Omaña:
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers. 533-544 - Qi Wang, Yiming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu:
Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems. 545-559 - Mishal Fatima Minhas, Osman Hasan
, Sa'ed Abed
:
HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital Circuits. 561-567
Volume 37, Number 5, December 2021
- Vishwani D. Agrawal:
Editorial. 569-570 - 2020 JETTA-TTTC Best Paper Award. 571-572
- TTTC Newsletter. 573-575
- Muralidharan Jayabalan
, E. Srinivas, Francis H. Shajin, Paulthurai Rajesh:
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization. 577-592 - Jaynarayan T. Tudu
, Satyadev Ahlawat, Sonali Shukla, Virendra Singh:
A Framework for Configurable Joint-Scan Design-for-Test Architecture. 593-611 - Zsombor Petho
, Intiyaz Khan, Árpád Török
:
Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations. 613-621 - E. Jagadeeswara Rao
, P. Samundiswary:
Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing Application. 623-631 - Sisir Kumar Jena
, Santosh Biswas, Jatindra Kumar Deka:
Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement. 633-652 - Md Toufiq Hasan Anik
, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration. 653-673 - Takefumi Yoshikawa
, Masahiro Ishimaru, Tatsuya Iwata, Fuma Mori, Kazutoshi Kobayashi:
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment. 675-684 - Nikolaos Georgoulopoulos
, Alkiviades A. Hatzopoulos:
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog. 685-700 - Xiaoyan Yang, Chenglin Yang
, Houjun Wang:
A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm. 701-713 - Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich:
Stress-Aware Periodic Test of Interconnects. 715-728
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