"Impact of impurities, interface traps and contacts on MoS2 MOSFETs: ..."

Gioele Mirabelli et al. (2017)

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DOI: 10.1109/ESSDERC.2017.8066648

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

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Gioele Mirabelli, Farzan Gity, Scott Monaghan, Paul K. Hurley, Ray Duffy:
Impact of impurities, interface traps and contacts on MoS2 MOSFETs: Modelling and experiments. ESSDERC 2017: 288-291

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