"Traps Based Reliability Barrier on Performance and Revealing Early Ageing ..."

Aniket Gupta et al. (2021)

> Home

Details and statistics

DOI: 10.1109/IRPS46558.2021.9405185

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/GuptaBSBPBAC21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/GuptaBSBPBAC21
Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan:
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. IRPS 2021: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.