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ORCIDOm Prakash 0007
Person information
- affiliation: Karlsruhe Institute of Technology, Germany
Other persons with the same name
- Om Prakash — disambiguation page
- Om Prakash 0001
![[0000-0001-6395-9989]](https://dblp.dagstuhl.de/img/orcid-mark.12x12.png "0000-0001-6395-9989")
— Gwangju Institute of Science and Technology, South Korea (and 1 more) - Om Prakash 0002 — The Institute of Mathematical Sciences, Chennai, Tamil Nadu, India (and 1 more)
- Om Prakash 0003 — GE Global Research, Bangalore, India
- Om Prakash 0004 — Indian Institute of Technology Patna, Department of Mathematics, India
- Om Prakash 0005 — University of Petroleum and Energy Studies, Department of Aerospace Engineering, Dehradun, India (and 2 more)
- Om Prakash 0006 — Indian Institute of Technology Kharagpur, Department of Mechanical Engineering, Systems, Dynamics, and Control Laboratory, India
- Om Prakash 0008 — Raja Ramanna Centre for Advanced Technology (RRCAT), Indore, India
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2020 – today
- 2023
[c15]Om Prakash, Kai Ni, Hussam Amrouch:
Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness. IRPS 2023: 1-4- [c14]Om Prakash, Rodion Novkin, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Ramesh Karri, Farshad Khorrami, Hussam Amrouch:
Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning. ISCAS 2023: 1-5 - 2022
- [c13]Kai Ni, Om Prakash, Simon Thomann, Zijian Zhao, Shan Deng, Hussam Amrouch:
Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications. IRPS 2022: 1-8 - [c12]Om Prakash, Kai Ni, Hussam Amrouch:
Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing. IRPS 2022: 1-10 - [c11]Navjeet Bagga, Kai Ni, Nitanshu Chauhan, Om Prakash, X. Sharon Hu, Hussam Amrouch:
Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage. IRPS 2022: 5-1 - 2021
- [j2]Om Prakash, Nitanshu Chauhan, Aniket Gupta, Hussam Amrouch:
Performance Optimization of Analog Circuits in Negative Capacitance Transistor Technology. Microelectron. J. 115: 105193 (2021) - [c10]Aniket Gupta, Nitanshu Chauhan, Om Prakash, Hussam Amrouch:
Variability Effects in FinFET Transistors and Emerging NC-FinFET. ICICDT 2021: 1-4 - [c9]Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan:
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. IRPS 2021: 1-6 - [c8]Om Prakash, Chetan K. Dabhi, Yogesh Singh Chauhan, Hussam Amrouch:
Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. VTS 2021: 1-7 - [c7]Simon Thomann, Chao Li, Cheng Zhuo, Om Prakash, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch:
On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. VTS 2021: 1-6 - 2020
- [j1]Hussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Chetan K. Dabhi, Florian Klemme, Om Prakash, Yogesh Singh Chauhan:
Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(9): 3127-3137 (2020) - [c6]Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch:
Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology. ASP-DAC 2020: 68-73 - [c5]Om Prakash, Hussam Amrouch, Sanjeev Manhas, Jörg Henkel:
Impact of NBTI Aging on Self-Heating in Nanowire FET. DATE 2020: 1514-1519 - [c4]Kai Ni, Aniket Gupta, Om Prakash, Simon Thomann, Xiaobo Sharon Hu, Hussam Amrouch:
Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET. IRPS 2020: 1-5 - [c3]Govind Bajpai, Aniket Gupta, Om Prakash, Girish Pahwa, Jörg Henkel, Yogesh Singh Chauhan, Hussam Amrouch:
Impact of Radiation on Negative Capacitance FinFET. IRPS 2020: 1-5 - [c2]Aniket Gupta, Kai Ni, Om Prakash, Xiaobo Sharon Hu, Hussam Amrouch:
Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET. IRPS 2020: 1-5
2010 – 2019
- 2019
- [c1]Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel:
Reliability Challenges with Self-Heating and Aging in FinFET Technology. IOLTS 2019: 68-71
Coauthor Index
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