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"Study of the Walk-Out Effect of Junction Breakdown Instability of the ..."
Chieh Roger Lo et al. (2020)
- Chieh Roger Lo, Teng-Hao Yeh, Wei-Chen Chen, Hang-Ting Lue
, Keh-Chung Wang, Chih-Yuan Lu, Yao-Wen Chang, Yung-Hsiang Chen, Chu-Yung Liu:
Study of the Walk-Out Effect of Junction Breakdown Instability of the High-Voltage Depletion-Mode N-Channel MOSFET for NAND Flash Peripheral Device and an Efficient Layout Solution. IRPS 2020: 1-6
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